Cryogenic Q enhancement in 50 GHz piezoelectric resonators

J Jack Kramer J Joshua Campbell (Department of Electrical and Computer Engineering, The University of Texas at Austin 2 , Austin, Texas 78712,) T Tzu-Hsuan Hsu (Department of Electrical and Computer Engineering, The University of Texas at Austin 2 , Austin, Texas 78712,) I Ian Anderson (California Institute of Technology) R Ruochen Lu (Department of Electrical and Computer Engineering, The University of Texas at Austin 2 , Austin, Texas 78712,)

Abstract

Piezoelectric resonators are a critical component of many systems. Recent advances have increased the operation frequency of these resonators into the tens to hundreds of GHz; however, the performance is still limited to moderate quality factors in the low hundreds. When viewed through the lens of the frequency-quality factor product, which can illustrate frequency-scaled loss mechanisms, a perceived limit becomes apparent. To probe this limit, we characterize solidly mounted piezoelectric resonators at cryogenic temperatures (7 K). The resonators provide mechanical robustness, as well as high-frequency shear modes around 50 GHz. Both the loaded and unloaded quality factors of these modes see enhancement with the temperature reduction, suggesting the impact of temperature-dependent fundamental loss mechanisms. This provides a launching pad for further dedicated studies to examine how energy dissipation occurs in these emerging high-frequency resonators.

Article Details

Volume / Issue Vol. 128, Issue 10
Published March 09, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (5)

J

Jack Kramer

J

Joshua Campbell

Department of Electrical and Computer Engineering, The University of Texas at Austin 2 , Austin, Texas 78712,

T

Tzu-Hsuan Hsu

Department of Electrical and Computer Engineering, The University of Texas at Austin 2 , Austin, Texas 78712,

I

Ian Anderson

California Institute of Technology

R

Ruochen Lu

Department of Electrical and Computer Engineering, The University of Texas at Austin 2 , Austin, Texas 78712,