Cross-Ag disk-covered GaAs microstructure for refractive index sensing by the surface plasmon resonance
Abstract
This paper presents a hybrid two-dimensional (2D) microstructure, consisting of an Ag layer and a GaAs dielectric sandwich, which enhances sensing capabilities by exciting surface plasmon resonance in the metal layer, distinguishing it from conventional guided mode resonance structures. The absorption peak reaches a maximum of 99.8% with a full width at half maximum of 0.18 THz. We analyze the electric field distribution at the absorption peak and discuss the resonance mechanism based on coupled-mode theory and impedance matching. Additionally, the shifts in absorption peaks are investigated as the refractive index of the analyte varies from 1.0 to 1.3, showing a sensitivity of 4.8 THz/RIU. The proposed 2D grating structure demonstrates great potential for applications in biomedical diagnostics, food safety, and environmental monitoring.
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (2)
Yongyuan Huang
School of Physics and Optoelectronic Engineering, Guangdong University of Technology 1 , Guangzhou 510006,
Bo Wang