Cross-Ag disk-covered GaAs microstructure for refractive index sensing by the surface plasmon resonance

Y Yongyuan Huang (School of Physics and Optoelectronic Engineering, Guangdong University of Technology 1 , Guangzhou 510006,) B Bo Wang

Abstract

This paper presents a hybrid two-dimensional (2D) microstructure, consisting of an Ag layer and a GaAs dielectric sandwich, which enhances sensing capabilities by exciting surface plasmon resonance in the metal layer, distinguishing it from conventional guided mode resonance structures. The absorption peak reaches a maximum of 99.8% with a full width at half maximum of 0.18 THz. We analyze the electric field distribution at the absorption peak and discuss the resonance mechanism based on coupled-mode theory and impedance matching. Additionally, the shifts in absorption peaks are investigated as the refractive index of the analyte varies from 1.0 to 1.3, showing a sensitivity of 4.8 THz/RIU. The proposed 2D grating structure demonstrates great potential for applications in biomedical diagnostics, food safety, and environmental monitoring.

Article Details

Volume / Issue Vol. 126, Issue 16
Published April 21, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (2)

Y

Yongyuan Huang

School of Physics and Optoelectronic Engineering, Guangdong University of Technology 1 , Guangzhou 510006,

B

Bo Wang