Controlling the optical-feedback-instability of VCSELs through inter-mesa coupling

S Shihao Ding (Beijing National Laboratory for Molecular Sciences Center for Soft Matter Science and Engineering Key Laboratory of Polymer Chemistry and Physics of Ministry of Education, and College of Chemistry and Molecular Engineering Peking University Beijing 100871 China) J Jian Feng (Department of Chemical Engineering) J Jianan Duan (National Key Laboratory of Laser Spatial Information, Guangdong Provincial Key Laboratory of Integrated Photonic-Electronic Chip, Harbin Institute of Technology 2 , Shenzhen 518055,) W Wenjie Rao (College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,) S Shaochi Pan (College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,) J Jilong Li (College of Materials Science and Engineering, State Key Laboratory of Advanced Design and Manufacturing Technology for Vehicle) S Shupeng Deng (College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,) J Jinlong Lu (College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,) N Nannan Li C Chuyu Zhong (College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,) H Hui Li C Cun-Zheng Ning (College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,)

Abstract

The rapid advancement of artificial intelligence and cloud computing has led to a strong demand for high-speed vertical-cavity surface-emitting lasers (VCSELs). Omitting the optical isolator in short-range modules based on VCSELs reduces costs but requires higher optical-feedback tolerance. Thus, exploring VCSELs with strong resistance to optical feedback is pivotal for the development of high-speed short-range optical modules. This study proposes coupled-mesa VCSELs (CM-VCSELs) as a robust strategy against external feedback. We investigated the feedback effects in VCSELs experimentally and numerically by systematically varying the inter-VCSEL distance. Compared to VCSELs without lateral coupling, we found that the inter-VCSEL coupling leads to significantly improved stability with reduced linewidth and relative intensity noise. Furthermore, there is an optimum inter-VCSEL distance where the linewidth is the smallest for a given optical-feedback strength. To verify the conventional understanding, we extracted the linewidth enhancement factor (LEF), confirming that the stability improvement stems from the lower LEF. Our study demonstrates that CM-VCSELs offer a large design tolerance window for VCSELs, and that feedback instability can be controlled through inter-mesa distance. Our strategy provides a low-cost manufacturable approach to VCSEL-based short-range high-speed modules.

Article Details

Volume / Issue Vol. 128, Issue 21
Published May 25, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (12)

S

Shihao Ding

Beijing National Laboratory for Molecular Sciences Center for Soft Matter Science and Engineering Key Laboratory of Polymer Chemistry and Physics of Ministry of Education, and College of Chemistry and Molecular Engineering Peking University Beijing 100871 China

J

Jian Feng

Department of Chemical Engineering

J

Jianan Duan

National Key Laboratory of Laser Spatial Information, Guangdong Provincial Key Laboratory of Integrated Photonic-Electronic Chip, Harbin Institute of Technology 2 , Shenzhen 518055,

W

Wenjie Rao

College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,

S

Shaochi Pan

College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,

J

Jilong Li

College of Materials Science and Engineering, State Key Laboratory of Advanced Design and Manufacturing Technology for Vehicle

S

Shupeng Deng

College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,

J

Jinlong Lu

College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,

N

Nannan Li

C

Chuyu Zhong

College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,

H

Hui Li

C

Cun-Zheng Ning

College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University 1 , Shenzhen 518118,