Composition-dependent ferroelectricity in epitaxial AlYN
Abstract
We report molecular beam epitaxy and ferroelectric properties of Al1-xYxN thin films with Y composition up to x = 41%. Structural characterization reveals that a wurtzite lattice structure is well preserved despite the large lattice distortions induced by increasing Y content. Both the coercive field and remanent polarization show a strong dependence on Y composition. The coercive field varies from 5.5 to 2.8 MV/cm with increasing Y compositions from 10% to 41%, whereas the remanent polarization is reduced from 140 to 70 μC/cm2. These properties are further compared with previously reported AlScN and GaScN. This study establishes AlYN as a tunable ferroelectric ultrawide-bandgap semiconductor for next-generation electronic, photonic, and electromechanical devices.
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (11)
Rui Shen
Department of Electrical Engineering and Computer Science, University of Michigan
Md Mehedi Hasan Tanim
Yutong Gan
Department of Electrical Engineering and Computer Science, University of Michigan 1 , Ann Arbor, Michigan 48109,
Jiangnan Liu
Shubham Mondal
Yiran Li
Samuel Yang
Parag Deotare
Department of Electrical Engineering and Computer Science, University of Michigan 1 , Ann Arbor, Michigan 48109,
Mackillo Kira
Department of Electrical Engineering and Computer Science, University of Michigan 1 , Ann Arbor, Michigan 48109,
Kai Sun
Zetian Mi