Comparative study of aging-induced optical and electrical degradation and dynamic stability in GaN-on-sapphire and GaN-on-GaN micro-LEDs

S Shan Huang Z Zichun Li (The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,) Y Yibo Liu F Feng Feng (Department of Pharmaceutical Analysis) J Jingyang Zhang (Key Laboratory for Green Chemical Technology of Ministry of Education, Collaborative Innovation Center of Chemical Science and Engineering, School of Chemical Engineering and Technology) X Xinyi Liu R Ruixiang Zhu (The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,) Y Yinan Zhang (Stoddart Institute of Molecular Science, Department of Chemistry, Zhejiang Key Laboratory of Excited-State Energy Conversion and Energy Storage, State Key Laboratory of Silicon and Advanced Semiconductor Materials) Z Zhaoyong Liu (The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,) F Fion Yeung (The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,) M Manchun Tseng (The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,) H Hoi Sing Kwok (The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,) M Man Hoi Wong (SEMATECH 2 , Albany, New York 12203,) Z Zhaojun Liu (State Key Laboratory of Multiphase Flow in Power Engineering, Frontier Institute of Science and Technology)

Abstract

The aging behavior of GaN-based micro-light-emitting diodes (micro-LEDs) is strongly influenced by substrate material and device structures, yet systematic comparisons remain limited. In this work, we compared the aging-induced optical and electrical degradation of horizontal GaN-on-sapphire and GaN-on-GaN micro-LEDs under ultra-high current-density stress. The GaN-on-sapphire devices exhibit significant full width at half maximum (FWHM) broadening, peak wavelength shifts, reduced optical power, increased reverse leakage current, and elevated series resistance after aging, indicating enhanced defect-assisted recombination as well as increased carrier scattering and trapping. In contrast, GaN-on-GaN micro-LEDs show markedly improved stability in optical and electrical characteristics. Further frequency-dependent and voltage-dependent electrical analyses reveal substrate-dependent defect evolution during aging. Furthermore, step-current-density stress tests demonstrate superior dynamic voltage stability in GaN-on-GaN micro-LEDs, especially in vertical structures. These findings underscore the importance of GaN substrates and current transport geometry for improving micro-LED aging reliability.

Article Details

Volume / Issue Vol. 128, Issue 14
Published April 06, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (14)

S

Shan Huang

Z

Zichun Li

The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,

Y

Yibo Liu

F

Feng Feng

Department of Pharmaceutical Analysis

J

Jingyang Zhang

Key Laboratory for Green Chemical Technology of Ministry of Education, Collaborative Innovation Center of Chemical Science and Engineering, School of Chemical Engineering and Technology

X

Xinyi Liu

R

Ruixiang Zhu

The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,

Y

Yinan Zhang

Stoddart Institute of Molecular Science, Department of Chemistry, Zhejiang Key Laboratory of Excited-State Energy Conversion and Energy Storage, State Key Laboratory of Silicon and Advanced Semiconductor Materials

Z

Zhaoyong Liu

The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,

F

Fion Yeung

The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,

M

Manchun Tseng

The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,

H

Hoi Sing Kwok

The State Key Laboratory of Displays and Opto-Electronics, The Hong Kong University of Science and Technology 1 , Hong Kong,

M

Man Hoi Wong

SEMATECH 2 , Albany, New York 12203,

Z

Zhaojun Liu

State Key Laboratory of Multiphase Flow in Power Engineering, Frontier Institute of Science and Technology