Characterization of anisotropic charge carrier mobility in PM6:Y6 blend film using time-resolved terahertz spectroscopy

J Jiale He J Jiacong Li H Hanyue Yang (National Laboratory of Solid State Microstructures, School of Physics, and Collaborative Innovation Center for Advanced Microstructures, Nanjing University 2 , Nanjing 210093,) R Ruoyu Zheng (College of Physics, Nanjing University of Aeronautics and Astronautics, and Key Laboratory of Aerospace Information Materials and Physics (NUAA), MIIT 1 , Nanjing 211106,) C Chunfeng Zhang R Rui Wang

Abstract

In organic photovoltaic (OPV) devices, charge transport from donor–acceptor interfaces to electrodes is crucial for efficient photon-to-current conversion. In state-of-the-art OPV systems featuring non-fullerene acceptors (NFAs), the face-on packing of planar NFAs can result in anisotropic charge transport mobilities in the in-plane and out-of-plane directions. Nevertheless, compared to the extensive research focusing on in-plane charge mobility using time-resolved terahertz spectroscopy (TRTS), the more critical out-of-plane charge mobility has rarely been explored due to technical limitations. Here, we utilized a high-sensitivity TRTS detection system that varies the angle of incident light to examine the mobility differences in different directions within a model system of a PM6:Y6 film. Our findings indicate that at an optimized annealing temperature of 110 °C, the out-of-plane mobility reaches 2.4 cm2 V−1 s−1, approximately six times that of the in-plane mobility, which is 0.41 cm2 V−1 s−1. This substantial anisotropy necessitates a combination of molecular-level π–π stacking and optimal domain morphology. These results provide key evidence for optimizing molecular orientation to establish favorable charge transport pathways for better-performing OPV devices.

Article Details

Volume / Issue Vol. 127, Issue 21
Published November 24, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (6)

J

Jiale He

J

Jiacong Li

H

Hanyue Yang

National Laboratory of Solid State Microstructures, School of Physics, and Collaborative Innovation Center for Advanced Microstructures, Nanjing University 2 , Nanjing 210093,

R

Ruoyu Zheng

College of Physics, Nanjing University of Aeronautics and Astronautics, and Key Laboratory of Aerospace Information Materials and Physics (NUAA), MIIT 1 , Nanjing 211106,

C

Chunfeng Zhang

R

Rui Wang