Characteristics of transport properties in ultra-wide bandgap Al0.65Ga0.35N channel HEMTs with low contact resistance and high breakdown voltage (>2.5 kV)

S Swarnav Mukhopadhyay (Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,) K Khush Gohel (Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,) S Surjava Sanyal (Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,) M Mayand Dangi (Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,) R Rajnin I. Roya (Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,) R Ruixin Bai (Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,) J Jiahao Chen (Spin-X Institute, School of Chemistry and Chemical Engineering, School of Biomedical Sciences and Engineering, Guangdong-Hong Kong-Macao Joint Laboratory of Optoelectronic and Magnetic Functional Materials, State Key Laboratory of Luminescent Materials and Devices) Q Qinchen Lin (Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,) G Guangying Wang C Chirag Gupta (Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,) S Shubhra S. Pasayat (Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,)

Abstract

Ultra-wide bandgap (UWBG) Al0.65Ga0.35N channel high electron mobility transistors (HEMTs) were deposited using a close-coupled showerhead metal-organic chemical vapor deposition reactor on AlN-on-sapphire templates to investigate the effect of transport properties of the two-dimensional electron gas (2DEG) on the epitaxial structure design. The impact of various scattering phenomena on AlGaN channel HEMTs was analyzed with respect to the channel, buffer, and AlN interlayer design, revealing that the alloy disorder and ionized impurity scattering mechanisms were predominant, limiting the mobility of 2DEG up to 180 cm2/Vs for a sheet charge density of 1.1 × 1013 cm−2. A surface roughness of <1 nm (2 μm × 2 μm atomic force microscopy scan) was achieved for the epitaxial structures demonstrating superior crystalline quality. The fabricated HEMT device showed state-of-the-art contact resistivity (ρc = 8.35 × 10−6 Ω · cm2), low leakage current (<10−6 A/mm), high ION/IOFF ratio (>105), a breakdown voltage of 2.55 kV, and a Baliga's figure of merit of 260 MW/cm2. This study demonstrates the optimization of the structural design of UWBG AlGaN channel HEMTs and its effect on transport properties to obtain state-of-the-art device performance.

Article Details

Volume / Issue Vol. 126, Issue 15
Published April 01, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (11)

S

Swarnav Mukhopadhyay

Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,

K

Khush Gohel

Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,

S

Surjava Sanyal

Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,

M

Mayand Dangi

Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,

R

Rajnin I. Roya

Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,

R

Ruixin Bai

Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,

J

Jiahao Chen

Spin-X Institute, School of Chemistry and Chemical Engineering, School of Biomedical Sciences and Engineering, Guangdong-Hong Kong-Macao Joint Laboratory of Optoelectronic and Magnetic Functional Materials, State Key Laboratory of Luminescent Materials and Devices

Q

Qinchen Lin

Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,

G

Guangying Wang

C

Chirag Gupta

Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,

S

Shubhra S. Pasayat

Department of Electrical and Computer Engineering, University of Wisconsin-Madison , Madison, Wisconsin 53706,