A proposal for full-field microwave polarization measurement in a Rydberg-atom mixer assisted by grating

Z Zheng Yin W Wengeng Wang (Qingdao Key Laboratory of Terahertz Technology, College of Electronic and Information Engineering 1 , Qingdao 266590,) D Di Meng Z Zhengmao Jia (Qingdao Key Laboratory of Terahertz Technology, College of Electronic and Information Engineering 1 , Qingdao 266590,) X Xiangguan Tan (Qingdao Key Laboratory of Terahertz Technology, College of Electronic and Information Engineering 1 , Qingdao 266590,) A Alexander Maassen van den Brink (Research Center for Applied Sciences, Academia Sinica 3 , Taipei 115-29,) L Lijun Li X Xiao Lu Y Yandong Peng (Qingdao Key Laboratory of Terahertz Technology, College of Electronic and Information Engineering 1 , Qingdao 266590,)

Abstract

A scheme of grating-assisted full-field (0°–180°) microwave (MW) polarization measurement is theoretically proposed using a Rydberg-atom mixer via electromagnetically induced transparency in the absence of a magnetic field. The probe spectrum reads out the mixed MW signal and is modulated by an optical grating. It is found that the multi-slit interference leads to the enhancement of the grating spectrum, which substantially enhances the distinguishability of MW polarization. The simulation result shows that the minimum resolvable polarization angle is about 0.04°, and the ratio of bandwidth-angle resolution is introduced to improve polarization measurement. Moreover, the MW field strength and the phase difference between local and signal MW fields could affect the symmetry of the grating spectrum, which helps to determine the polarization angles of the MW field from 0° to 180° without the aid of magnetic fields.

Article Details

Volume / Issue Vol. 128, Issue 7
Published February 16, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (9)

Z

Zheng Yin

W

Wengeng Wang

Qingdao Key Laboratory of Terahertz Technology, College of Electronic and Information Engineering 1 , Qingdao 266590,

D

Di Meng

Z

Zhengmao Jia

Qingdao Key Laboratory of Terahertz Technology, College of Electronic and Information Engineering 1 , Qingdao 266590,

X

Xiangguan Tan

Qingdao Key Laboratory of Terahertz Technology, College of Electronic and Information Engineering 1 , Qingdao 266590,

A

Alexander Maassen van den Brink

Research Center for Applied Sciences, Academia Sinica 3 , Taipei 115-29,

L

Lijun Li

X

Xiao Lu

Y

Yandong Peng

Qingdao Key Laboratory of Terahertz Technology, College of Electronic and Information Engineering 1 , Qingdao 266590,