A comparative study of optical confinement and strain in GaN microdisk lasers with semi-suspended and DBR-based structures

Q Quan Peng (Laboratory of Micro/Nano-Optoelectronics, Department of Micro Electronic and Integrated Circuits, Xiamen University 1 , Xiamen 361005,) L Lilong Ma H Hongkun Zhong (Laboratory of Micro/Nano-Optoelectronics, Department of Micro Electronic and Integrated Circuits, Xiamen University 1 , Xiamen 361005,) L Leiying Ying (Laboratory of Micro/Nano-Optoelectronics, Department of Micro Electronic and Integrated Circuits, Xiamen University 1 , Xiamen 361005,) Z Zhan Su S Shaoqiang Chen (State Key Laboratory of Precision Spectroscopy, Department of Electronic Engineering, East China Normal University 2 , 500 Dongchuan Road, Shanghai 200241,) G Guoen Weng (State Key Laboratory of Precision Spectroscopy, Department of Electronic Engineering, East China Normal University 2 , 500 Dongchuan Road, Shanghai 200241,) Y Yang Mei (Zhejiang Key Laboratory of Biology and Ecological Regulation of Crop Pathogens and Insects, Institute of Insect Sciences, Zhejiang University) B Baoping Zhang

Abstract

In this study, GaN-based microdisk lasers with two different underlying structures, namely, a bottom distributed Bragg reflector (DBR) based structure and a semi-suspended structure formed through partial undercutting of the former, are fabricated from the same epitaxial wafer and systematically compared. The distinct strain distributions, optical confinements, and their combined effects on the lasing characteristics are thoroughly analyzed. The bottom DBRs introduce additional tensile strain in the top GaN layer, effectively mitigating the quantum-confined Stark effect, but provide no significant advantage in whispering-gallery-mode confinement compared to the semi-suspended structure. Owing to the synergistic influence of strain and optical confinement, the semi-suspended devices exhibit lower thresholds, narrower linewidths, shorter lasing wavelengths, and faster stimulated-emission rates.

Article Details

Volume / Issue Vol. 129, Issue 1
Published July 06, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (9)

Q

Quan Peng

Laboratory of Micro/Nano-Optoelectronics, Department of Micro Electronic and Integrated Circuits, Xiamen University 1 , Xiamen 361005,

L

Lilong Ma

H

Hongkun Zhong

Laboratory of Micro/Nano-Optoelectronics, Department of Micro Electronic and Integrated Circuits, Xiamen University 1 , Xiamen 361005,

L

Leiying Ying

Laboratory of Micro/Nano-Optoelectronics, Department of Micro Electronic and Integrated Circuits, Xiamen University 1 , Xiamen 361005,

Z

Zhan Su

S

Shaoqiang Chen

State Key Laboratory of Precision Spectroscopy, Department of Electronic Engineering, East China Normal University 2 , 500 Dongchuan Road, Shanghai 200241,

G

Guoen Weng

State Key Laboratory of Precision Spectroscopy, Department of Electronic Engineering, East China Normal University 2 , 500 Dongchuan Road, Shanghai 200241,

Y

Yang Mei

Zhejiang Key Laboratory of Biology and Ecological Regulation of Crop Pathogens and Insects, Institute of Insect Sciences, Zhejiang University

B

Baoping Zhang