A 614 MW/cm2 AlGaN-channel Schottky barrier diode with high breakdown voltage and high temperature sensitivity

H Heyuan Chen (Key Laboratory of Wide Band Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University 1 , Xi'an 710071,) T Tao Zhang H Huake Su (State Key Laboratory of Wide-Bandgap Semiconductor Devices and Integrated Technology, School of Microelectronics, Xidian University 1 , Xi'an 710071,) X Xiangdong Li S Shengrui Xu Y Yachao Zhang R Ruowei Liu (Key Laboratory of Wide Band Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University 1 , Xi'an 710071,) L Lei Xie Y Yue Hao J Jincheng Zhang

Abstract

In this work, a high-performance AlGaN-channel Schottky barrier diode with high breakdown voltage of 2.23 kV defined at anode leakage current of 1 μA and high power figure-of-merit of 614 MW/cm2 is demonstrated. Anode voltage (VA) with a clear linear relationship as a function of temperature from 300 to 525 K shows great potential for temperature sensors, and maximum temperature sensitivity of 2.0 mV/K at anode current density (IA) of 6.28 × 10−8 A is obtained, satisfying the low power consumption requirement. Meanwhile, the corresponding temperature sensitivity of ln(–I) vs temperature at a fixed VA of –15 V is 5.0 mA/K, and the suppressed temperature sensitivity at reverse bias is attributed to the energy-band modulated Schottky barrier height of AlGaN-channel M/S interface, which is vital for high-temperature and high-power applications.

Article Details

Volume / Issue Vol. 126, Issue 1
Published January 06, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (10)

H

Heyuan Chen

Key Laboratory of Wide Band Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University 1 , Xi'an 710071,

T

Tao Zhang

H

Huake Su

State Key Laboratory of Wide-Bandgap Semiconductor Devices and Integrated Technology, School of Microelectronics, Xidian University 1 , Xi'an 710071,

X

Xiangdong Li

S

Shengrui Xu

Y

Yachao Zhang

R

Ruowei Liu

Key Laboratory of Wide Band Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University 1 , Xi'an 710071,

L

Lei Xie

Y

Yue Hao

J

Jincheng Zhang