1.5 kV <b> <i>β</i> </b>-Ga2O3 vertical Schottky diodes with 58 A surge current and off-state stressing study

Y Yitao Feng (National Key Laboratory of Wide Bandgap Semiconductor Devices and Integrated Technology, School of Microelectronics, Xidian University 1 , Xi'an 710071,) H Hong Zhou (Shanghai Collaborative Innovation Center of Agri-Seeds, School of Agriculture and Biology, Shanghai Jiao Tong University) S Sami Alghamdi (Department of Electrical and Computer Engineering, Faculty of Engineering, King Abdulaziz University 3 , Jeddah 21589,) S Saud Wasly (King Abdulaziz University 3 , Jeddah 21589,) Y Yue Hao J Jincheng Zhang

Abstract

This study advances the development of vertical, large-area (3 × 3 mm2) β-Ga2O3 Schottky barrier diodes (SBDs) by incorporating double field plates and N ion implantation-based edge terminations (ETs) to significantly enhance the breakdown voltage (BV). By using ETs to suppress the concentrated electric field (E-field) at the anode edge, we achieved a BV of 1.5 kV with a specific on-resistance (Ron,sp) of 9.2 mΩ cm2. The diodes demonstrated a forward current (IF) of 11.2 A at 2 V and an impressive peak surge current of 58 A, with corresponding surge energy and power of 2.24 J and 553 W, respectively. Despite being 44% larger, our SBD exhibited a low reverse recovery time and negligible reverse loss, comparable to commercially available high-specification 30 A SiC diodes. Furthermore, even under stress at −1 kV for 103 s, Von shifted only slightly by 0.1 V, and ΔRon,sp increased by just 4.9%. The diode also demonstrated exceptional robustness at elevated temperatures, with an IF decrease in only 24% at 175 °C. These simultaneously achieved IF, BV, and Ron, and surge characteristics highlight the potential of β-Ga2O3 SBDs as next-generation commercial high-voltage, industrial-level power electronics devices.

Article Details

Volume / Issue Vol. 126, Issue 18
Published May 05, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (6)

Y

Yitao Feng

National Key Laboratory of Wide Bandgap Semiconductor Devices and Integrated Technology, School of Microelectronics, Xidian University 1 , Xi'an 710071,

H

Hong Zhou

Shanghai Collaborative Innovation Center of Agri-Seeds, School of Agriculture and Biology, Shanghai Jiao Tong University

S

Sami Alghamdi

Department of Electrical and Computer Engineering, Faculty of Engineering, King Abdulaziz University 3 , Jeddah 21589,

S

Saud Wasly

King Abdulaziz University 3 , Jeddah 21589,

Y

Yue Hao

J

Jincheng Zhang