Fast Interfacial Hole Consumption Suppresses Space–Charge Layer Trap Filling in BiVO ₄ Photoanodes

Longren Li

Department of Chemistry, Imperial College London, Molecular Science Research Hub, 82 Wood Lane, White City Campus, London W12 0BZ, U.K.

Tong Wang

Beier Hu

Department of Chemistry, Imperial College London, Molecular Science Research Hub, 82 Wood Lane, White City Campus, London W12 0BZ, U.K.

Louise I. Oldham

Department of Chemistry, Imperial College London, Molecular Science Research Hub, 82 Wood Lane, White City Campus, London W12 0BZ, U.K.

Qiyun Chen

Department of Chemistry, Imperial College London, Molecular Science Research Hub, 82 Wood Lane, White City Campus, London W12 0BZ, U.K.

Keming Li

Department of Chemistry, Imperial College London, Molecular Science Research Hub, 82 Wood Lane, White City Campus, London W12 0BZ, U.K.

Chuxi Yang

Department of Chemistry, Imperial College London, Molecular Science Research Hub, 82 Wood Lane, White City Campus, London W12 0BZ, U.K.

Paransa Alimard

Department of Chemistry, Imperial College London, Molecular Science Research Hub, 82 Wood Lane, White City Campus, London W12 0BZ, U.K.

Zhu Meng

Department of Chemistry, Imperial College London, Molecular Science Research Hub, 82 Wood Lane, White City Campus, London W12 0BZ, U.K.

Haoqing Ning

Department of Chemistry, Imperial College London, Molecular Science Research Hub, 82 Wood Lane, White City Campus, London W12 0BZ, U.K.

James R. Durrant

Chemistry Research Laboratory

Andreas Kafizas

Department of Chemistry, Imperial College London, Molecular Science Research Hub, 82 Wood Lane, White City Campus, London W12 0BZ, U.K.

Artem A. Bakulin

Department of Chemistry and Centre for Processable Electronics