Fast Interfacial Hole Consumption Suppresses Space–Charge Layer Trap Filling in BiVO 4 Photoanodes - Longren Li; Tong Wang; Beier Hu; Louise I. Oldham; Qiyun Chen; Keming Li; Chuxi Yang; Paransa Alimard; Zhu Meng; Haoqing Ning; James R. Durrant; Andreas Kafizas; et al. (Journal of the American Chemical Society, 2026)