Journal of the American Chemical Society

Atomic-Scale Imaging of Li <sup>+</sup> Trapping at Defects in Degraded LiCoO <sub>2</sub>

C Chenxi Zheng (International Center for Quantum Materials, School of Physics) X Xiaoyue Gao (International Center for Quantum Materials, School of Physics) W Wencong Feng (State Key Laboratory of Advanced Technology for Materials Synthesis and Processing) L Lujun Zhu (Beijing Key Laboratory for Theory and Technology of Advanced Battery Materials, School of Materials Science and Engineering) Y Yue Ma J Junping Luo (International Center for Quantum Materials, School of Physics) T Tao Wang X Xiumei Ma (Electron Microscopy Laboratory, School of Physics) S Shulin Chen (Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits)) J Jiake Wei (Tsientang Institute for Advanced Study) Q Quanquan Pang P Peng Gao
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Article Details

Volume / Issue Vol. 148, Issue 20
Published May 27, 2026
Pages 20489-20496
ISSN 0002-7863
Publisher American Chemical Society

Journal Info

Journal of the American Chemical Society

American Chemical Society
ISSN: 0002-7863 Physical Sciences

Authors (12)

C

Chenxi Zheng

International Center for Quantum Materials, School of Physics

X

Xiaoyue Gao

International Center for Quantum Materials, School of Physics

W

Wencong Feng

State Key Laboratory of Advanced Technology for Materials Synthesis and Processing

L

Lujun Zhu

Beijing Key Laboratory for Theory and Technology of Advanced Battery Materials, School of Materials Science and Engineering

Y

Yue Ma

J

Junping Luo

International Center for Quantum Materials, School of Physics

T

Tao Wang

X

Xiumei Ma

Electron Microscopy Laboratory, School of Physics

S

Shulin Chen

Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits)

J

Jiake Wei

Tsientang Institute for Advanced Study

Q

Quanquan Pang

P

Peng Gao

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