Zheng, C., Gao, X., Feng, W., Zhu, L., Ma, Y., Luo, J., Wang, T., Ma, X., Chen, S., Wei, J., Pang, Q., Gao, P. (2026). Atomic-Scale Imaging of Li
                    <sup>+</sup>
                    Trapping at Defects in Degraded LiCoO
                    <sub>2</sub>. Journal of the American Chemical Society. https://doi.org/10.1021/jacs.6c00433