X-ray near-field multi-slice ptychography for in-situ imaging
Abstract
Abstract In-situ imaging of chemical reactions can provide valuable insight into nanoparticle growth and structural evolution. Hard X-ray imaging is an excellent tool for this purpose, as it combines high spatial resolution with high penetration depth, allowing for realistic reaction environments. While far-field ptychography is a well-established method at synchrotron radiation sources, its near-field analog has received less attention. In this work we show that near-field multi-slice ptychography is a competitive method for high-resolution in-situ imaging by studying the formation of gold nanocages via galvanic replacement. Our work extends near-field X-ray ptychography to sub-50 nm spatial resolution by using multilayer Laue lenses. These high numerical aperture optics enable to distinguish sample layers that are separated by less than 100 µm by multi-slicing techniques.
Article Details
Authors (14)
Sina Röper
Karolina Stachnik
Jonas Voss
Sarah-Alexandra Hussak
Mattias Åstrand
Lukas Grote
Felix Wittwer
Martin Seyrich
Sven Niese
Peter Gawlitza
Ulrich Vogt
Christian G. Schroer
Dorota Koziej
University of Hamburg, Institute for Nanostructure and Solid-State Physics, Center for Hybrid Nanostructures, Luruper Chaussee 149, Hamburg 22761, Germany
Andreas Schropp