White-noise quality evaluation in chaotic oscillation of Josephson junction for random-number generation

D D. Oikawa (Department of Electrical and Electronic Engineering, National Institute of Technology, Toyota College 1 , Eisei-cho 2-1, Toyota, Aichi 471-8525,) H H. Komatsu (General Education Division, Faculty of Engineering, Kindai University 2 , Takaya-umenobe 1, Higashi-hiroshima, Hiroshima 739-2116,) K K. Tsuzuki (Department of Information and Computer Engineering, National Institute of Technology, Toyota College 3 , Eisei-cho 2-1, Toyota, Aichi 471-8525,) H H. Andoh (Department of Information and Computer Engineering, National Institute of Technology, Toyota College 3 , Eisei-cho 2-1, Toyota, Aichi 471-8525,)

Abstract

Recently, a high-quality random-number generator has been highly expected. In obtaining high-quality random-numbers, the use of random physical phenomena is necessary. Among random-number generation methods, we focused on the chaos in a Josephson junction (JJ) under irradiation with a radio frequency (RF). In this study, the chaos in the intrinsic JJ for random-number generation was numerically investigated using the equivalent circuit of the RF-irradiated JJ. In particular, it is important for the random-number generation to obtain a high-quality white-noise output signal. We proposed that the quality of the white noise is quantitatively evaluated using the half-width of the autocorrelation peak. Furthermore, random-numbers were generated from the chaos in the RF-irradiated JJ at high-speed operation than the previous study. The high-quality random-numbers were successfully generated from this chaos, and their quality was verified through statistical verification.

Article Details

Volume / Issue Vol. 138, Issue 14
Published October 14, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (4)

D

D. Oikawa

Department of Electrical and Electronic Engineering, National Institute of Technology, Toyota College 1 , Eisei-cho 2-1, Toyota, Aichi 471-8525,

H

H. Komatsu

General Education Division, Faculty of Engineering, Kindai University 2 , Takaya-umenobe 1, Higashi-hiroshima, Hiroshima 739-2116,

K

K. Tsuzuki

Department of Information and Computer Engineering, National Institute of Technology, Toyota College 3 , Eisei-cho 2-1, Toyota, Aichi 471-8525,

H

H. Andoh

Department of Information and Computer Engineering, National Institute of Technology, Toyota College 3 , Eisei-cho 2-1, Toyota, Aichi 471-8525,