Weak antilocalization effect on Bi2Te3/CdTe heterostructures grown on glass substrate by molecular beam epitaxy
Abstract
This work presents the experimental observation of the weak antilocalization effect (WAL) in Bi2Te3 samples covered with CdTe grown on glass and GaAs (001) substrates using molecular beam epitaxy. We show that the amplitude of WAL is very close in both samples, which opens the possibility of the implementation of a low-cost device that operates via spin transport using a glass substrate. The experimental data were analyzed using the Hikami–Larkin–Nagaoka model, which provided the important parameters of dephasing and spin–orbit scattering lengths. Also, the structural characterization has evidenced that the samples present almost the same crystalline quality, indicating that van der Waals epitaxy can produce good quality Bi2Te3 layers independent of the chosen substrate.
Article Details
Journal Info
Journal of Applied Physics
American Institute of Physics
Authors (7)
Deriky L. de Queiroz
Institute of Physics and Chemistry, Federal University of Itajubá 1 , Itajubá, Minas Gerais 37500-903,
Wesley F. Inoch
Department of Physics, Federal University of Viçosa 2 , Viçosa, Minas Gerais 36570-900,
Leonarde N. Rodrigues
Department of Physics, Federal University of Viçosa 2 , Viçosa, Minas Gerais 36570-900,
Sukarno O. Ferreira
Department of Physics, Federal University of Viçosa 2 , Viçosa, Minas Gerais 36570-900,
Bráulio S. Archanjo
National Institute of Metrology Quality and Technology (Inmetro), Materials Metrology Division (DIMAT) 3 , Xerém, Rio de Janeiro 25250-020,
M. L. Peres
Institute of Physics and Chemistry, Federal University of Itajubá 1 , Itajubá, Minas Gerais 37500-903,
S. De Castro