Wafer-scale 2D MoS2 transistors with self-aligned angstrom gate length and nanometer channel length
Z
Ziming Wang
A
Anhan Liu
H
Hengbin Ding
F
Fan Wu
C
Caifang Gao
Y
Yizhe Guo
R
Ruifang Xue
P
Peigen Zhang
Y
Yanming Liu
T
Tao Deng
(China-UK Low Carbon College)
T
Tian-Ling Ren
H
He Tian
(Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, China.)
Article Details
Journal
Nature Communications
Volume / Issue
Vol. 1, Issue 1
Published
July 11, 2026
ISSN
2041-1723
Publisher
Nature Portfolio
Authors (12)
Z
Ziming Wang
A
Anhan Liu
H
Hengbin Ding
F
Fan Wu
C
Caifang Gao
Y
Yizhe Guo
R
Ruifang Xue
P
Peigen Zhang
Y
Yanming Liu
T
Tao Deng
China-UK Low Carbon College
T
Tian-Ling Ren
H
He Tian
Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, China.
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