Journal of the American Chemical Society

Unveiling Water-Vapor-Promoted Oxidation of Palladium Nanoparticles via Atomic-Scale Transmission Electron Microscopy at Atmospheric Pressure

R Ruiyang You (Center of Electron Microscopy and State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering) M Meiliang Ma (Center of Electron Microscopy and State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering) Z Zihan Wang X Xiaoyun Guo (Center of Electron Microscopy and State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering) S Songda Li (Center of Electron Microscopy and State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering) Y Yang Ou (Center of Electron Microscopy and State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering) W Wentao Yuan (Center of Electron Microscopy and State Key Laboratory of Silicon Materials, School of Materials Science and Engineering) Z Zhong-Kang Han (State Key Laboratory of Silicon Materials, School of Materials Science and Engineering) Y Ying Jiang Y Yong Wang
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Article Details

Volume / Issue Vol. 147, Issue 31
Published August 06, 2025
Pages 28035-28043
ISSN 0002-7863
Publisher American Chemical Society

Journal Info

Journal of the American Chemical Society

American Chemical Society
ISSN: 0002-7863 Physical Sciences

Authors (10)

R

Ruiyang You

Center of Electron Microscopy and State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering

M

Meiliang Ma

Center of Electron Microscopy and State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering

Z

Zihan Wang

X

Xiaoyun Guo

Center of Electron Microscopy and State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering

S

Songda Li

Center of Electron Microscopy and State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering

Y

Yang Ou

Center of Electron Microscopy and State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering

W

Wentao Yuan

Center of Electron Microscopy and State Key Laboratory of Silicon Materials, School of Materials Science and Engineering

Z

Zhong-Kang Han

State Key Laboratory of Silicon Materials, School of Materials Science and Engineering

Y

Ying Jiang

Y

Yong Wang

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