Ultra-soft magnetic properties in Ta/NiFe laminated system

G Gopika C. T. (Nanomaterials Research Laboratory, Surface Engineering Division, CSIR—National Aerospace Laboratories 1 , Bangalore 560 017,) A Apoorva Kaul (Nanomaterials Research Laboratory, Surface Engineering Division, CSIR—National Aerospace Laboratories 1 , Bangalore 560 017,) B Bhagaban Behera (Nanomaterials Research Laboratory, Surface Engineering Division, CSIR—National Aerospace Laboratories 1 , Bangalore 560 017,) S S. K. Ghosh A A. Biswas (Atomic and Molecular Physics Division, Bhabha Atomic Research Centre 4 , Mumbai 400085,) S Santosh Kumar Sahoo (Department of Metallurgical and Materials Engineering, NIT 3 , Rourkela 769008,) S S. Narayana Jammalamadaka (Magnetic Materials Device Physics Laboratory, Department of Physics, Indian Institute of Technology Hyderabad 5 , Kandi, Sangareddy, Hyderabad 502 284,) P P. Chowdhury (Nanomaterials Research Laboratory, Surface Engineering Division, CSIR—National Aerospace Laboratories 1 , Bangalore 560 017,)

Abstract

An integrated magnetic flux concentrator (MFC) has become a choice for enhancing the sensitivity of a magnetic field sensor. However, the flux concentrator’s geometry and its ultra-soft magnetic properties are the key ingredients for successful implementation to improve the detectability of a magnetic sensor. In this report, the laminated stack of Ta/Ru/[NiFe(tNiFe)/Ta(tTa)]N/Ta of thickness 0.5 μm was investigated, where tNiFe, tTa, and N were varied to optimize ultra-soft magnetic properties of the film and compared them with the bulk NiFe film. Structural investigations revealed that incorporating an ultra-thin layer of Ta in the laminated stack suppresses the grain growth of the NiFe phase and improves the textured growth of the fcc(111) phase of the NiFe alloy. This results in dramatic improvement of the measured magnetic hysteresis loop of the laminated stack with a reduced coercivity field in the range of 0.4 ± 0.1 Oe, high linearity, and low saturation field (<10 Oe) while comparing them with the bulk film of NiFe of equivalent thicknesses. The laminated stack thickness of up to 4 μm was further investigated, and the bilinear M(H) loop was explained through antiferromagnetic (AFM) interlayer coupling between successive NiFe layers.

Article Details

Volume / Issue Vol. 138, Issue 6
Published August 14, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (8)

G

Gopika C. T.

Nanomaterials Research Laboratory, Surface Engineering Division, CSIR—National Aerospace Laboratories 1 , Bangalore 560 017,

A

Apoorva Kaul

Nanomaterials Research Laboratory, Surface Engineering Division, CSIR—National Aerospace Laboratories 1 , Bangalore 560 017,

B

Bhagaban Behera

Nanomaterials Research Laboratory, Surface Engineering Division, CSIR—National Aerospace Laboratories 1 , Bangalore 560 017,

S

S. K. Ghosh

A

A. Biswas

Atomic and Molecular Physics Division, Bhabha Atomic Research Centre 4 , Mumbai 400085,

S

Santosh Kumar Sahoo

Department of Metallurgical and Materials Engineering, NIT 3 , Rourkela 769008,

S

S. Narayana Jammalamadaka

Magnetic Materials Device Physics Laboratory, Department of Physics, Indian Institute of Technology Hyderabad 5 , Kandi, Sangareddy, Hyderabad 502 284,

P

P. Chowdhury

Nanomaterials Research Laboratory, Surface Engineering Division, CSIR—National Aerospace Laboratories 1 , Bangalore 560 017,