The Manhattan exciton size: A physically tractable delocalization measure

T T. L. C. Jansen (University of Groningen, Zernike Institute for Advanced Materials , Nijenborgh 3, 9747 AG Groningen,)

Abstract

Delocalized excitations, denoted excitons, play an important role in many systems in chemical physics. The characterization of their extent of delocalization is a crucial element in understanding these quasiparticles. In this paper, I will revisit the most common delocalization measures applied to Frenkel-type excitons. Based on this analysis, I propose to use a so-far ignored measure. The key advantage of this measure, which I will denote as the Manhattan exciton size, is that it directly connects with the oscillator strength of the excitons. It provides a strict upper bound on the oscillator strength of any given exciton for linear aggregates. Finally, I demonstrate that this exciton delocalization measure is more sensible for analyzing super-radiant states compared to, for example, the most commonly applied measure, i.e., the (inverse) participation ratio. However, these two measures together provide insight into the degree of exciton confinement.

Article Details

Volume / Issue Vol. 162, Issue 7
Published February 21, 2025
ISSN 0021-9606
Publisher American Institute of Physics

Journal Info

The Journal of Chemical Physics

American Institute of Physics

ISSN: 0021-9606 Physical Sciences

Authors (1)

T

T. L. C. Jansen

University of Groningen, Zernike Institute for Advanced Materials , Nijenborgh 3, 9747 AG Groningen,