Terminations Determine Energy‐Level Alignment of Perovskite Buried Interfaces
Abstract
Abstract The “substrate‐effect”, where the semiconduction type of perovskite changes according to that of the substrate is a widely‐reported, but so far not fully understood phenomenon in the field of perovskite. The main challenge lies in the difficulty of probing and comprehending the electronic properties of perovskite buried interfaces. Here, through broadly investigating 20 buried interfaces formed between different perovskites and organic hole or electron transport materials (HTMs or ETMs), it is revealed that the substrate‐effect originates from the distinct energy‐level alignments at HTM or ETM substrates. Experimental and theoretical studies reveal that this difference stems from varying proportions of two perovskite terminations, which are determined by the interaction between substrates and perovskite crystals. With such mechanism, the semiconduction type of perovskite by controlling the proportion of surface terminations is successfully tuned. These findings provide new insights into optimizing device performance through termination engineering.
Article Details
Authors (12)
Yang Li
Junnan Guo
Key Laboratory for Liquid‐Solid Structural Evolution and Processing of Materials Ministry of Education Shandong University Jinan 250061 P. R. China
Jihua Tan
Department of Chemistry City University of Hong Kong Hong Kong SAR P. R. China
Ping Man
Department of Chemistry and Center of Super‐Diamond & Advanced Films (COSDAF) City University of Hong Kong Kowloon China
Shiang Li
Zixin Zeng
Thuc Hue Ly
Department of Chemistry and Center of Super‐Diamond & Advanced Films City University of Hong Kong Kowloon China
Sai‐Wing Tsang
Department of Materials Science and Engineering Hong Kong Institute for Clean Energy City University of Hong Kong Kowloon Tong Hong Kong SAR China
Xinhui Lu
Department of Physics
Weikang Wu
Key Laboratory for Liquid‐Solid Structural Evolution and Processing of Materials (MOE) Shandong University Jinan 250061 China
Chun‐Sing Lee
Department of Chemistry City University of Hong Kong Kowloon Hong Kong SAR P. R. China
Zhiqiang Guan