Study of carrier-mediated photothermal dynamics in a silicon wafer

D Dragan M. Todorovic (Institute for Multidisciplinary Research, University of Belgrade 1 , P.O. Box 33, Belgrade 11030,) S Slobodanka P. Galovic (“Vinča” Institute of Nuclear Sciences—National Institute of thе Republic of Serbia, University of Belgrade 2 , P.O.Box 522, Belgrade 11000,) M Marica N. Popovic (Institute of Physics Belgrade, National Institute of the Republic of Serbia, University of Belgrade 3 , Pregrevica 118, Belgrade (Zemun) 11080,)

Abstract

The interplay between plasma and thermal transport phenomena in semiconductors under optical excitation is fundamental to optoelectronics and forms the physical basis of photothermal and photoacoustic techniques. In this work, we develop a comprehensive one-dimensional multi-physics model that describes the coupled spatiotemporal dynamics of photogenerated charge carriers and heat transfer in a crystalline silicon (Si) wafer surrounded by air. The model consistently couples photogeneration, diffusion, and recombination of charge carriers with heat generation arising from carrier thermalization and from non-radiative bulk and surface recombination processes. The theoretical framework is based on the ambipolar diffusion equation within the low-level injection approximation for the carrier plasma, combined with heat conduction equations governing the temperature distribution in the illuminated sample. Time-domain simulations under rectangular optical pulse excitation reveal distinct dynamic regimes governed by the relation between the pulse duration and the characteristic plasma rise time. We identify the physical origin of key temporal features of the thermal response, including surface-localized thermal overshoot, and quantify the separation between fast plasma kinetics and slow thermal diffusion. The results provide a unified physical framework for interpreting time-resolved photothermal and photoacoustic signals in semiconductors and offer practical guidelines for experiment design and signal analysis.

Article Details

Volume / Issue Vol. 139, Issue 12
Published March 28, 2026
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (3)

D

Dragan M. Todorovic

Institute for Multidisciplinary Research, University of Belgrade 1 , P.O. Box 33, Belgrade 11030,

S

Slobodanka P. Galovic

“Vinča” Institute of Nuclear Sciences—National Institute of thе Republic of Serbia, University of Belgrade 2 , P.O.Box 522, Belgrade 11000,

M

Marica N. Popovic

Institute of Physics Belgrade, National Institute of the Republic of Serbia, University of Belgrade 3 , Pregrevica 118, Belgrade (Zemun) 11080,