Spot crosstalk characterization of microchannel plates

Abstract

This study investigates the relationship between spot crosstalk performance and microchannel plate (MCP) parameters. MCPs are commonly employed in particle detectors, such as Intensified sCMOS (IsCMOS) or Intensified CCD cameras, to enhance the detection of energetic particles. However, crosstalk, which refers to interference between neighboring spots, can significantly impact the accuracy of spot energy measurements. We developed a three-dimensional micro via array structure simulation model using computer simulation technology to explore this relationship. The simulation utilized the Furman secondary electron emission model and employed the three-dimensional particle-in-cell method to quantitatively calculate spot crosstalk at the MCP output. The validation of our simulation results against experimental data demonstrated good agreement. Our simulations revealed that the dispersion radius and gain predominantly influence spot crosstalk within the microchannel. By judiciously selecting and adjusting operating parameters, the spot crosstalk performance of the MCP can be optimized. This study enhances the understanding of spot crosstalk in MCPs and offers valuable insights for enhancing the performance of spatially resolved particle detectors. Through further research and optimization, we can enhance the accuracy and reliability of measurements in various applications utilizing MCP-based detection systems.