Small defect detection in printed circuit boards based on the multiscale edge strengthening and an improved YOLOv10
W
Weixun Chen
X
Xuneng Ke
S
Siming Meng
Article Details
Journal
Scientific Reports
Volume / Issue
Vol. 15, Issue 1
Published
October 17, 2025
ISSN
2045-2322
Publisher
Nature Portfolio
Authors (3)
W
Weixun Chen
X
Xuneng Ke
S
Siming Meng
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