Simple analytical models of spectral focusing stimulated Raman scattering microscopy

Abstract

Stimulated Raman Scattering (SRS) microscopy is a powerful, rapid label-free, and chemical-specific imaging modality. While the underlying physics is well understood and modeled numerically, we show that, with simple approximations, one can derive equations which enable rapid simulations. Here, we develop an analytical model for spectral focusing SRS microscopy, validate it against numerical simulations, and apply it to the analysis of several experimental implementations. Of use to experimentalists, our model permits rapid simulation of advanced modulation schemes for background (non-Raman) signal removal in SRS microscopy. We compare and discuss their relative advantages and drawbacks.