Rectification and bolometric terahertz radiation detectors based on perforated graphene structures exhibiting plasmonic resonant response

V V. Ryzhii (Research Institute of Electrical Communication, Tohoku University 1 , Sendai 980-8577,) C C. Tang (Research Institute of Electrical Communication, Tohoku University 1 , Sendai 980-8577,) M M. Ryzhii (School of Computer Science and Engineering, University of Aizu 3 , Aizu-Wakamatsu 965-8580,) T T. Otsuji (International Research Institute of Disaster Science, Tohoku University 6 , Sendai 980-8578,) M M. S. Shur (Electronics of the Future, Inc. 4 , Vienna, Virginia 22181-6117,)

Abstract

We propose and evaluate the characteristics of the terahertz (THz) detectors based on perforated graphene layers (PGLs). The PGL structures constitute the interdigital in-plane arrays of the graphene microribbons (GMRs) connected by the sets of narrow constrictions, which form the graphene nanoribbon bridges (GNRs). The PGL detector operation is associated with the rectification and hot-carrier bolometric mechanisms. The excitation of plasmonic oscillations in the GMR-GNR arrays can reinforce these mechanisms. The room-temperature PGL detector responsivity and detectivity are calculated as a function of radiation frequency and device structure parameters. The effects of the rectification and hot-carrier mechanisms are compared. The PGL THz detectors under consideration can exhibit highly competitive values of responsivity and detectivity.

Article Details

Volume / Issue Vol. 137, Issue 24
Published June 28, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (5)

V

V. Ryzhii

Research Institute of Electrical Communication, Tohoku University 1 , Sendai 980-8577,

C

C. Tang

Research Institute of Electrical Communication, Tohoku University 1 , Sendai 980-8577,

M

M. Ryzhii

School of Computer Science and Engineering, University of Aizu 3 , Aizu-Wakamatsu 965-8580,

T

T. Otsuji

International Research Institute of Disaster Science, Tohoku University 6 , Sendai 980-8578,

M

M. S. Shur

Electronics of the Future, Inc. 4 , Vienna, Virginia 22181-6117,