Quantitative Tactile Sensing of Surface Microstructures Through Time‐Domain Analysis of Piezoelectric Twin Signals

J Jiaqi Tu (Institute of Flexible Electronics Technology of THU Jiaxing Zhejiang 314000 China) Z Zheren Cai (Innovative Centre For Flexible Devices (iFLEX) Max Planck–NTU Joint Lab for Artificial Senses School of Materials Science and Engineering Nanyang Technological University Singapore Singapore) Z Zhihua Liu J Jiangtao Su (Innovative Centre for Flexible Devices (iFLEX), Max Planck–NTU Joint Lab for Artificial Senses, School of Materials Science and Engineering, Nanyang Technological University) Y Yanzhen Li (Innovative Centre for Flexible Devices (iFLEX), Max Planck−NTU Joint Laboratory for Artificial Senses, School of Materials Science and Engineering) X Xue Feng Z Zequn Cui (Innovative Centre for Flexible Devices (iFLEX) Max Planck–NTU Joint Lab for Artificial Senses School of Materials Science and Engineering Nanyang Technological University 50 Nanyang Avenue Singapore 639798 Singapore) X Xiaodong Chen (Innovative Centre for Flexible Devices (iFLEX), Max Planck-NTU Joint Lab for Artificial Senses, School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Republic of Singapore)

Abstract

Abstract Tactile sensors enabling human‐like behavior to identify surface microstructures are essential for humanoid robots to interact precisely with complex environments. Most existing approaches use materials responding to dynamic forces and rely on machine learning methods to distinguish various types of surface microstructures. Quantitatively profiling the surface microstructures is significant but challenging, especially under the requirement of eliminating external bulky motion‐control systems. Here, a quantitative tactile surface profiling strategy is presented through time‐domain analysis of the signal of a piezoelectric twin‐film architecture. The architecture uses two parallel piezoelectric films with a fixed interlayer distance, generating twin voltage signals with a time delay, which is inversely proportional to the scanning speed, and consequently removes the need for motion control. The microstructure heights correlate with the peak voltages, whereas widths and edge profiles are derived from the temporal analysis of distinct signal features. Tactile and in situ measurement of surface microstructures is demonstrated with high accuracy (>99.2%) over a broad height range of 1–1000 µm. Furthermore, in‐line quality inspection during additive manufacturing is realized by quantitatively profiling the surface microstructures. This work will drive innovations in tactile technologies that emulate and potentially surpass human capabilities and advance in situ surface characterization methods.

Article Details

Volume / Issue Vol. 38, Issue 2
Published January 01, 2026
ISSN 0935-9648
Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (8)

J

Jiaqi Tu

Institute of Flexible Electronics Technology of THU Jiaxing Zhejiang 314000 China

Z

Zheren Cai

Innovative Centre For Flexible Devices (iFLEX) Max Planck–NTU Joint Lab for Artificial Senses School of Materials Science and Engineering Nanyang Technological University Singapore Singapore

Z

Zhihua Liu

J

Jiangtao Su

Innovative Centre for Flexible Devices (iFLEX), Max Planck–NTU Joint Lab for Artificial Senses, School of Materials Science and Engineering, Nanyang Technological University

Y

Yanzhen Li

Innovative Centre for Flexible Devices (iFLEX), Max Planck−NTU Joint Laboratory for Artificial Senses, School of Materials Science and Engineering

X

Xue Feng

Z

Zequn Cui

Innovative Centre for Flexible Devices (iFLEX) Max Planck–NTU Joint Lab for Artificial Senses School of Materials Science and Engineering Nanyang Technological University 50 Nanyang Avenue Singapore 639798 Singapore

X

Xiaodong Chen

Innovative Centre for Flexible Devices (iFLEX), Max Planck-NTU Joint Lab for Artificial Senses, School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Republic of Singapore