Purity control of simulated moving bed based on advanced fuzzy II controller

C Chao-Fan Xie T Ting Lin (Beijing National Center for Electron Microscopy and Laboratory of Advanced Materials, School of Materials Science and Engineering) H Hong Zhang

Abstract

Simulated Moving Bed (SMB) is the optimal technology for chromatographic separation, but its process is complex and sensitive to numerous parameters that affect separation performance, making it difficult to control. In recent years, fuzzy controllers have been widely applied in industry due to their simplicity, robustness, and ease of implementation. However, traditional fuzzy controllers used in industry do not consider the error acceleration term. In steady-state conditions, error acceleration is typically slightly less than the target value. Introducing the acceleration term, albeit non-fuzzy, in a proactive fuzzy I-type controller often leads to an increase in steady-state values. The study shows that, compared to the advanced fuzzy I-type controller, the extraction accuracy for material B improved by an average of 0.7%, while the accuracy for material A increased by 0.1%. Compared to traditional fuzzy controllers, the extraction accuracy for material B improved by an average of 0.35%, while the accuracy for material A remained relatively stable. In terms of stability analysis concerning variations in moving bed parameters, the advanced fuzzy II-type controller exhibited greater stability than the I-type, with an average precision stability improvement of 0.6%. Traditional fuzzy controllers demonstrated pathological characteristics during fluctuations in the switching time parameter, whereas the advanced fuzzy II type controller-maintained stability.

Article Details

Journal PLoS ONE
Volume / Issue Vol. 20, Issue 2
Published February 24, 2025
Pages e0314545
ISSN 1932-6203
Publisher Public Library of Science

Journal Info

PLoS ONE

Public Library of Science

ISSN: 1932-6203 Open Access Health Sciences

Authors (3)

C

Chao-Fan Xie

T

Ting Lin

Beijing National Center for Electron Microscopy and Laboratory of Advanced Materials, School of Materials Science and Engineering

H

Hong Zhang