Post-growth annealing for enhanced optical performance in dilute nitride III–V semiconductor nanowires

H Hidetoshi Hashimoto (Research Center for Integrated Quantum Electronics, Hokkaido University 2 , Sapporo 060-0813,) K Kaito Nakama (Research Center for Integrated Quantum Electronics, Hokkaido University 2 , Sapporo 060-0813,) R Ryoga Iida (Research Center for Integrated Quantum Electronics, Hokkaido University , North 13 West 8, Sapporo 060-0813,) T Takuto Goto (Research Center for Integrated Quantum Electronics, Hokkaido University , North 13 West 8, Sapporo 060-0813,) M Mahiro Sano (Research Center for Integrated Quantum Electronics, Hokkaido University , North 13 West 8, Sapporo 060-0813,) K Keisuke Minehisa (Research Center for Integrated Quantum Electronics, Hokkaido University 2 , North 13 West 8, Sapporo 060-0813,) F Fumitaro Ishikawa (Research Center for Integrated Quantum Electronics, Hokkaido University 2 , North 13 West 8, Sapporo 060-0813,)

Abstract

The effect of annealing on the optical properties of GaNAs and GaInNAs nanowires (NWs) was systematically studied by room-temperature photoluminescence and electron microscopy. Prolonged annealing at 750 °C for 1 h caused the arsenic desorption and thermal decomposition of GaAs-based NWs, whereas short-time treatments preserved morphology up to 750 °C and induced structural degradation only above 800 °C. Annealing enhanced emission intensity and reduced the spectral linewidth, indicating the suppression of point defects and improved optical uniformity. The most pronounced improvement was achieved under short-time annealing at 750 °C for 3 min, where the photoluminescence intensity reached its maximum. GaNAs showed a small blueshift of about 10 meV, while GaInNAs exhibited only a slight redshift, suggesting negligible In–Ga interdiffusion compared with thin films. These findings demonstrate that short-time, high-temperature annealing under arsenic overpressure is an effective strategy to enhance the optical quality of dilute nitride NWs.

Article Details

Volume / Issue Vol. 138, Issue 23
Published December 21, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (7)

H

Hidetoshi Hashimoto

Research Center for Integrated Quantum Electronics, Hokkaido University 2 , Sapporo 060-0813,

K

Kaito Nakama

Research Center for Integrated Quantum Electronics, Hokkaido University 2 , Sapporo 060-0813,

R

Ryoga Iida

Research Center for Integrated Quantum Electronics, Hokkaido University , North 13 West 8, Sapporo 060-0813,

T

Takuto Goto

Research Center for Integrated Quantum Electronics, Hokkaido University , North 13 West 8, Sapporo 060-0813,

M

Mahiro Sano

Research Center for Integrated Quantum Electronics, Hokkaido University , North 13 West 8, Sapporo 060-0813,

K

Keisuke Minehisa

Research Center for Integrated Quantum Electronics, Hokkaido University 2 , North 13 West 8, Sapporo 060-0813,

F

Fumitaro Ishikawa

Research Center for Integrated Quantum Electronics, Hokkaido University 2 , North 13 West 8, Sapporo 060-0813,