Photoinduced Structural Relaxation in Chiral Copper(l) Iodide Cluster Scintillators for Circularly Polarized Radioluminescence Imaging

P Pengyu Zhang (Institute of Condensed Matter and Material Physics, School of Physics) C Chen Li (Sibley School of Mechanical and Aerospace Engineering, Cornell University, Ithaca, NY, USA.) Y Yiping Du Q Qingsong Hu (Materials Science & Applied Physics Department, Division of Physical Science and Engineering (PSE)) Z Zhuoer Cai (School of Chemistry and Chemical Engineering Southeast University Nanjing P. R. China) S Sen Zhang L Ling Guan (Department of Orthodontics Peking University School and Hospital of Stomatology Beijing P. R. China) J Jiawen Xiao (Beijing Key Lab of Microstructure and Property of Solids, College of Materials Science and Engineering) B Bing Tang (Department of Chemistry) L Li Wang (The Affiliated Cancer Hospital of Zhengzhou University and Henan Cancer Hospital Zhengzhou China) F Feng Luo (National Key Laboratory of Uranium Resources Exploration-Mining and Nuclear Remote Sensing) Z Zhengguang Yan (College of Materials Science and Engineering, College of Physics and Optoelectronics Engineering, Beijing Key Laboratory of Microstructure and Properties of Solids Beijing University of Technology Beijing P. R. China)

Abstract

ABSTRACT Circularly polarized luminescence offers untapped potential for enhancing x‐ray imaging resolution by suppressing optical crosstalk, yet its integration into high‐performance scintillators remains unexplored. Here we report a new class of chiral copper(I) halide scintillators, including enantiopure R‑/S‑3‑MLCuI (3‐ML represents 3‐methylmorpholine) circularly polarized scintillators and racemic Rac‑3‑MLCuI scintillators. Strategic enantiomer selection enables precise control over crystal symmetry—chiral P4 2 2 1 2 vs. centrosymmetric C2/c—dictating chiroptical activity. Combining TD‐DFT, in situ XAS, and ultrafast spectroscopy, we elucidate that emission originates from cluster‐centered self‐trapped excitons confined within discrete [Cu 4 I 4 ] cores, where pronounced excited‐state Cu─Cu contraction and Cu─I elongation induce strong exciton‐phonon coupling. Homochiral ligand environments impart persistent chiral imprinting, yielding |g lum | values up to 1.0 × 10 −2 . The materials exhibit record light yields (58 000 photons•MeV −1 ), exceptional x‐ray stability (>99% retention after 115 Gy), and ultra‐low detection limits (78.9 n Gy air •s −1 ). A flexible S‐3‐MLCuI@TPU film incorporating polarization‐gated imaging achieves 21.2 lp/mm resolution—significantly surpassing conventional scintillators by suppressing optical crosstalk. High‑fidelity x‑ray imaging of complex biological and electronic structures is demonstrated. This work provides a structure–property relationship that enables circularly polarized scintillation in chiral copper–iodide clusters, offering insights for further development of related systems.

Article Details

Volume / Issue Vol. 38, Issue 38
Published July 01, 2026
ISSN 0935-9648
Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (12)

P

Pengyu Zhang

Institute of Condensed Matter and Material Physics, School of Physics

C

Chen Li

Sibley School of Mechanical and Aerospace Engineering, Cornell University, Ithaca, NY, USA.

Y

Yiping Du

Q

Qingsong Hu

Materials Science & Applied Physics Department, Division of Physical Science and Engineering (PSE)

Z

Zhuoer Cai

School of Chemistry and Chemical Engineering Southeast University Nanjing P. R. China

S

Sen Zhang

L

Ling Guan

Department of Orthodontics Peking University School and Hospital of Stomatology Beijing P. R. China

J

Jiawen Xiao

Beijing Key Lab of Microstructure and Property of Solids, College of Materials Science and Engineering

B

Bing Tang

Department of Chemistry

L

Li Wang

The Affiliated Cancer Hospital of Zhengzhou University and Henan Cancer Hospital Zhengzhou China

F

Feng Luo

National Key Laboratory of Uranium Resources Exploration-Mining and Nuclear Remote Sensing

Z

Zhengguang Yan

College of Materials Science and Engineering, College of Physics and Optoelectronics Engineering, Beijing Key Laboratory of Microstructure and Properties of Solids Beijing University of Technology Beijing P. R. China