Photoemission electron microscopy for connectomics
Abstract
Photoemission electron microscopy (PEEM) offers a potential third modality for large-volume connectomics alongside transmission electron microscopy (TEM) and scanning electron microscopy (SEM). We image osmium stained, ultrathin brain sections on gold coated silicon at synaptic resolution using commercial PEEMs. At coarser resolution, we demonstrate that ultraviolet laser illumination enables gigavoxel-per-second acquisition rates without thermal damage. PEEM combines TEM-like parallel detection with SEM-compatible solid supports into a potentially scalable and cost-effective approach for large-volume connectomes.
Article Details
Journal Info
Proceedings of the National Academy of Sciences
National Academy of Sciences
Authors (17)
Gregg Wildenberg
Department of Neurobiology, University of Chicago
Kevin M. Boergens
Department of Physics, University of Illinois Chicago
Lola Lambert
Department of Neurobiology, University of Chicago
Ruiyu Li
Department of Chemistry, University of Chicago
Allison Craig
James Franck Institute, University of Chicago
Michael K. L. Man
Okinawa Institute of Science and Technology, Femtosecond Spectroscopy Unit
Amin Moradi
Leiden Institute of Physics, Leiden University
Janek Rieger
Department of Chemistry, University of Chicago
Hengli Duan
Diamond Light Source, Harwell Science and Innovation Campus, Didcot OX11 0DE, United Kingdom
Sarnjeet S. Dhesi
Diamond Light Source, Magnetic Materials Group
Gabriel Karras
Francesco Maccherozzi
Diamond Light Source, Magnetic Materials Group
Keshav Dani
Okinawa Institute of Science and Technology, Femtosecond Spectroscopy Unit
Rudolf Tromp
Leiden Institute of Physics, Leiden University
Sense Jan van der Molen
Leiden Institute of Physics, Leiden University
Sarah B. King
Department of Chemistry
Narayanan Kasthuri
Department of Neurobiology, University of Chicago