Non-invasive single-shot wide-field imaging through dynamic thick scattering media base on a fully developed speckle pattern

M Minglong Hu (College of Mathematics and Physics, Beijing University of Chemical Technology , Beijing 100029,) C Chengyou Lin (College of Mathematics and Physics, Beijing University of Chemical Technology , Beijing 100029,) J Junjie Zhou S Shilin Ren (College of Mathematics and Physics, Beijing University of Chemical Technology , Beijing 100029,) L Liang Yin (State Key Laboratory of Fluorine and Nitrogen Chemistry and Advanced Materials, Shanghai Institute of Organic Chemistry, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 345 Lingling Road, Shanghai 200032, China) D Ding Yingchun (College of Mathematics and Physics, Beijing University of Chemical Technology , Beijing 100029,)

Abstract

Imaging through scattering media has always been a challenge to be solved in optical applications. The speckle autocorrelation method has achieved great success in non-invasive single-shot imaging through dynamic thin scattering media, but the field of view (FOV) is still limited by the optical memory effect (OME). Recently, there have also been methods focused on imaging through thick scattering media, but they either require prior knowledge of the samples or multiple speckle patterns. Here, we present an imaging method that enables non-invasive single-shot imaging through dynamic thick scattering media without the limitation on the FOV imposed by the OME. In the proof-of-principle experiments, we used a fully developed speckle pattern that combines a classical phase-retrieval algorithm to achieve imaging through a three-dimensional dynamic ∼2.5 mm thick chicken breast tissue, which exceeded the OME by ∼57 times. In addition, our method can also achieve lensless wide-field imaging through dynamic thin scattering media. We anticipate that our method will enable non-invasive single-shot wide-field imaging in currently inaccessible scenarios.

Article Details

Volume / Issue Vol. 137, Issue 22
Published June 14, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (6)

M

Minglong Hu

College of Mathematics and Physics, Beijing University of Chemical Technology , Beijing 100029,

C

Chengyou Lin

College of Mathematics and Physics, Beijing University of Chemical Technology , Beijing 100029,

J

Junjie Zhou

S

Shilin Ren

College of Mathematics and Physics, Beijing University of Chemical Technology , Beijing 100029,

L

Liang Yin

State Key Laboratory of Fluorine and Nitrogen Chemistry and Advanced Materials, Shanghai Institute of Organic Chemistry, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 345 Lingling Road, Shanghai 200032, China

D

Ding Yingchun

College of Mathematics and Physics, Beijing University of Chemical Technology , Beijing 100029,