Neuromorphic Transistors Integrating Photo‐Sensor, Optical Memory and Visual Synapses for Artificial Vision Application

T Tu Zhao W Wenbo Yue (Guangdong Provincial Key Laboratory of Chip and Integration Technology School of Electronic Science and Engineering (School of Microelectronics) South China Normal University Foshan 528225 P. R. China) Q Qunrui Deng (Guangdong Provincial Key Laboratory of Chip and Integration Technology School of Electronic Science and Engineering (School of Microelectronics) South China Normal University Foshan P. R. China) W Wenjie Chen C Chengming Luo (Guangdong Provincial Key Laboratory of Chip and Integration Technology School of Electronic Science and Engineering (School of Microelectronics) South China Normal University Foshan People's Republic of China) Y Yao Zhou M Meng Sun X Xueming Li Y Yujue Yang N Nengjie Huo

Abstract

Abstract In commercial artificial vision system (AVS), the sensing, storage, and computing units are usually physically separated due to their architecture and performance gaps, which thus increases the volume, complexity, and energy loss. This work develops a neuromorphic transistor integrating these different modules within one single device. Leveraging the gate‐tunable out‐of‐plane electric field, the device achieves the multi‐mode integration of photo‐sensor, optical memory, and visual synapse. When operating at negative top gate voltage (V TG ), a strong photo‐gating effect enables highly sensitive photo‐response with responsivity of ≈6.515 kA W −1 and detectivity up to ≈3.92 × 10 14 Jones. Due to the charge storage effect, it can also act as a non‐volatile multi‐level (>4 bits) optical memory with a long endurance of over 10 000 s and a high writing/erasing ratio of up to 10 6 . At zero or positive V TG , the transistor switches to visual synapse mode with neuromorphic computing capability, providing a pathway for complex biological learning and flexible synaptic plasticity. By further combining the synaptic plasticity with an artificial neural network (ANN), it achieves precise image recognition and classification with an accuracy of up to 95.26%. This work develops a multi‐mode transistor that integrates key components of an AVS, addressing the existing challenges of all‐in‐one integration and manufacturing complexity.

Article Details

Volume / Issue Vol. 37, Issue 27
Published July 01, 2025
ISSN 0935-9648
Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (10)

T

Tu Zhao

W

Wenbo Yue

Guangdong Provincial Key Laboratory of Chip and Integration Technology School of Electronic Science and Engineering (School of Microelectronics) South China Normal University Foshan 528225 P. R. China

Q

Qunrui Deng

Guangdong Provincial Key Laboratory of Chip and Integration Technology School of Electronic Science and Engineering (School of Microelectronics) South China Normal University Foshan P. R. China

W

Wenjie Chen

C

Chengming Luo

Guangdong Provincial Key Laboratory of Chip and Integration Technology School of Electronic Science and Engineering (School of Microelectronics) South China Normal University Foshan People's Republic of China

Y

Yao Zhou

M

Meng Sun

X

Xueming Li

Y

Yujue Yang

N

Nengjie Huo