Near-field infrared imaging of polar domain walls in Ni3TeO6

A Ashley M. Sargent (Department of Chemistry, University of Tennessee, Knoxville 1 , Knoxville, Tennessee 37996,) K Kevin A. Smith (Department of Chemistry, University of Tennessee, Knoxville 1 , Knoxville, Tennessee 37996,) X Xianghan Xu K Kai Du (State Key Laboratory of Materials Low-Carbon Recycling, College of Materials Science and Engineering) S Sang-Wook Cheong L Lukas Wehmeier (National Synchrotron Light Source II, Brookhaven National Laboratory 3 , Upton, New York 11973,) G G. L. Carr (National Synchrotron Light Source II, Brookhaven National Laboratory 3 , Upton, New York 11973,) J Janice L. Musfeldt (Department of Chemistry, University of Tennessee, Knoxville 1 , Knoxville, Tennessee 37996,)

Abstract

Domain walls are leading platforms for the development of ultra-low power switching and memory devices due to their potential to be moved, created, and erased in real time and to mitigate heat flux. Interface vs wavelength size effects unfortunately preclude the measurement of phonons by traditional spectroscopic techniques, so it has been challenging to unravel the primary excitations of the lattice and the symmetries that they represent across these functional interfaces. In this work, we employ synchrotron-based near-field infrared nanospectroscopy to image polar domain walls in multiferroic Ni3TeO6. This is a unique platform because, in addition to hosting polar and chiral domains that are interlocked with one another, Ni3TeO6 displays both charged and neutral interfaces depending upon the direction allowing the development of structure–property relations. From a local structure and a strain point of view, we find charged walls that are twice as wide as neutral walls as well as strong frequency shifts of vibrational modes across the charged walls. The near-field amplitude drops across the walls as well. We discuss these trends in terms of polarization and chirality as well as phonon lifetimes at functional interfaces.

Article Details

Volume / Issue Vol. 138, Issue 5
Published August 07, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (8)

A

Ashley M. Sargent

Department of Chemistry, University of Tennessee, Knoxville 1 , Knoxville, Tennessee 37996,

K

Kevin A. Smith

Department of Chemistry, University of Tennessee, Knoxville 1 , Knoxville, Tennessee 37996,

X

Xianghan Xu

K

Kai Du

State Key Laboratory of Materials Low-Carbon Recycling, College of Materials Science and Engineering

S

Sang-Wook Cheong

L

Lukas Wehmeier

National Synchrotron Light Source II, Brookhaven National Laboratory 3 , Upton, New York 11973,

G

G. L. Carr

National Synchrotron Light Source II, Brookhaven National Laboratory 3 , Upton, New York 11973,

J

Janice L. Musfeldt

Department of Chemistry, University of Tennessee, Knoxville 1 , Knoxville, Tennessee 37996,