Multichannel highly sensitive diamond quantum magnetometer

A A. Yoshimura (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8550,) A A. Kanamoto (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8550,) N N. Sekiguchi (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8550,) C C. Shinei (Research Center for Electronic and Optical Materials, National Institute for Materials Science 2 , Tsukuba, Ibaraki 305-0044,) M M. Miyakawa (Research Center for Materials Nanoarchitectonics, National Institute for Materials Science 4 , Tsukuba, Ibaraki 305-0044,) T T. Taniguchi T T. Teraji (Research Center for Electronic and Optical Materials, National Institute for Materials Science 3 , 1-1 Namiki, Tsukuba, Ibaraki 305-0044,) H H. Abe (Takasaki Institute for Advanced Quantum Science, National Institutes for Quantum Science and Technology 5 , Takasaki, Gunma 370-1292,) S S. Onoda (Takasaki Institute for Advanced Quantum Science, National Institutes for Quantum Science and Technology 5 , Takasaki, Gunma 370-1292,) T T. Ohshima (Takasaki Institute for Advanced Quantum Science, National Institutes for Quantum Science and Technology 5 , Takasaki, Gunma 370-1292,) T T. Iwasaki (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8550,) M M. Hatano (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8550,)

Abstract

We demonstrate a highly sensitive real-time magnetometry method at two measurement points. This magnetometry method is based on the frequency-division multiplexing of continuous-wave optically detected magnetic resonance. We use two ensembles of nitrogen-vacancy (NV) centers separated by 3.6 mm to measure a magnetic field. A different bias field is applied to the two NV ensembles to resolve the resonance peak for each ensemble in the frequency space and enables the multiplexed magnetometry at the two points. The sensitivities achieved at the measurement points are 21 and 22pT/Hz. The proposed magnetometry method can be expanded to include more measurement points and shorter spacing. The capability of real-time measurement at numerous points with short spacing and high sensitivity is beneficial for various applications, including biomagnetic sensing, geophysical research, and material science.

Article Details

Volume / Issue Vol. 139, Issue 14
Published April 14, 2026
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (12)

A

A. Yoshimura

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8550,

A

A. Kanamoto

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8550,

N

N. Sekiguchi

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8550,

C

C. Shinei

Research Center for Electronic and Optical Materials, National Institute for Materials Science 2 , Tsukuba, Ibaraki 305-0044,

M

M. Miyakawa

Research Center for Materials Nanoarchitectonics, National Institute for Materials Science 4 , Tsukuba, Ibaraki 305-0044,

T

T. Taniguchi

T

T. Teraji

Research Center for Electronic and Optical Materials, National Institute for Materials Science 3 , 1-1 Namiki, Tsukuba, Ibaraki 305-0044,

H

H. Abe

Takasaki Institute for Advanced Quantum Science, National Institutes for Quantum Science and Technology 5 , Takasaki, Gunma 370-1292,

S

S. Onoda

Takasaki Institute for Advanced Quantum Science, National Institutes for Quantum Science and Technology 5 , Takasaki, Gunma 370-1292,

T

T. Ohshima

Takasaki Institute for Advanced Quantum Science, National Institutes for Quantum Science and Technology 5 , Takasaki, Gunma 370-1292,

T

T. Iwasaki

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8550,

M

M. Hatano

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8550,