Molecular and Electronic Structures at Electrochemical Interfaces from <i>In Situ</i> Resonant X-Ray Diffraction

Y Yvonne Soldo-Olivier (Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel) Y Yves Joly (Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel) M Maurizio De Santis (Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel) Y Yvonne Gründer (Oliver Lodge Laboratory, Department of Physics) N Nils Blanc (Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel) E Eric Sibert (Univ. Grenoble Alpes, Univ. Savoie Mont Blanc, CNRS)

Article Details

Volume / Issue Vol. 147, Issue 6
Published February 12, 2025
Pages 5106-5113
ISSN 0002-7863
Publisher American Chemical Society

Journal Info

Journal of the American Chemical Society

American Chemical Society

ISSN: 0002-7863 Physical Sciences

Authors (6)

Y

Yvonne Soldo-Olivier

Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel

Y

Yves Joly

Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel

M

Maurizio De Santis

Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel

Y

Yvonne Gründer

Oliver Lodge Laboratory, Department of Physics

N

Nils Blanc

Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel

E

Eric Sibert

Univ. Grenoble Alpes, Univ. Savoie Mont Blanc, CNRS