Modeling of total ionizing dose (TID) effects on the nonuniform distribution of Si/SiO2 interface trap energy states in MOS devices
A
Ali Khoshnoud
J
Javad Yavandhassani
Article Details
Journal
Scientific Reports
Volume / Issue
Vol. 15, Issue 1
Published
May 16, 2025
ISSN
2045-2322
Publisher
Nature Portfolio
Authors (2)
A
Ali Khoshnoud
J
Javad Yavandhassani
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