Miniaturized broadband absorber based on fractal structure metasurface

P Pufan Bai (School of Electronic and Information Engineering, Beihang University 1 , Beijing 100191,) H Hui Deng Z Zixiong Liu (State Key Laboratory of Integrated Chips and Systems and School of Microelectronics, Fudan University 1 , Shanghai 200433,) Y Yang Cai T Tongsheng Xia (School of Electronic and Information Engineering, Beihang University 1 , Beijing 100191,) X Xiangfen Wan (School of Reliability and System Engineering, Beihang University 3 , Beijing 100191,)

Abstract

A broadband metasurface microwave absorber with a miniaturized size is presented under two mechanisms. A frequency selective surface based on the Minkowski (MSK) fractal structure is constructed to provide a lower resonance frequency with the similar size, and the Salisbury screen is designed to create high-frequency resonance. Then, a second-order MSK fractal ring is loaded to realize impedance matching over the entire bandwidth. The absorption performance of the metasurface absorber (MA) proposed is validated by the equivalent transmission line model, the Smith chart, and the surface current distribution. The simulation results demonstrate an absorption bandwidth of 125% with an absorption rate of >90% over 0.3–1.3 GHz. The thickness of the proposed absorber is 0.075λ, and the size of the unit cell is 0.1λ. The developed absorber exhibits stable absorption performance for both TE and TM polarizations within an incident angle of 40°. The experimental results agree with those of full-wave simulation.

Article Details

Volume / Issue Vol. 137, Issue 22
Published June 14, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (6)

P

Pufan Bai

School of Electronic and Information Engineering, Beihang University 1 , Beijing 100191,

H

Hui Deng

Z

Zixiong Liu

State Key Laboratory of Integrated Chips and Systems and School of Microelectronics, Fudan University 1 , Shanghai 200433,

Y

Yang Cai

T

Tongsheng Xia

School of Electronic and Information Engineering, Beihang University 1 , Beijing 100191,

X

Xiangfen Wan

School of Reliability and System Engineering, Beihang University 3 , Beijing 100191,