Metal–Organic Chemical Vapor Deposition of 2D Semiconducting Bi <sub>2</sub> O <sub>2</sub> S for High‐Performance Field‐Effect Transistor

H Hyun‐Jun Chai (Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea) M Minsoo Kang A Ayoung Ham (Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea) H Han Beom Jeong C Cheolmin Park Y Yong‐Sung Kim (Korea Research Institute of Standards &amp; Science (KRISS) Daejeon 34113 Republic of Korea) E Eunpyo Park (Center for Semiconductor Technology Korea Institute of Science and Technology (KIST) Seoul 02792 Republic of Korea) G Gichang Noh (Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea) M Min‐kyung Jo (Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea) W Woonggi Hong (Department of Foundry Engineering, Dankook University 1 , 152 Jukjeon-ro, Suji-gu, Yongin-si, Gyeonggi-do 16890,) M Mingu Kang T Tae Soo Kim S Suhyun Kim J Jeongwon Park J Jaehyun Lee M Min‐gyu Kim (Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea) S Seongdae Kwon (Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea) H Hyeonbin Park (Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea) J Joon Young Kwak (Division of Electronic and Semiconductor Engineering Ewha Womans University Seoul 03760 Republic of Korea) S Seungwoo Song (Operando Methodology and Measurement Team Korea Research Institute of Standards &amp; Science (KRISS) Daejeon 34113 Republic of Korea) S Sung‐Yool Choi (School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST) Daejeon Republic of Korea) H Hu Young Jeong S Seunghwan Seo (Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea) K Kibum Kang (Graduate School of Semiconductor Technology Korea Advanced Institute of Science and Technology (KAIST) Daejeon Republic of Korea)

Abstract

Abstract Bi 2 O 2 S has emerged as a promising 2D semiconductor for high‐performance field‐effect transistor (FET) applications, effectively addressing limitations observed in conventional 2D materials, including environmental instability, challenges with achieving optimal bandgaps, and insufficient static power efficiency. However, practical application of Bi 2 O 2 S has been hindered by synthesis challenges; previous methods often relied on high‐temperature processes (&gt;700 °C) for precursor sublimation resulting in the formation of undesired phases or solution‐based approaches that compromise material quality. In this work, the growth of single‐crystalline Bi 2 O 2 S nanoplates at a low temperature of ≈400 °C is demonstrated using metal–organic chemical vapor deposition (MOCVD), achieving a bandgap of 1.2 eV compatible with Si‐based devices. Fabricated Bi 2 O 2 S‐based FETs through this process exhibit excellent electrical performance, with a maximum on/off ratio of 3.6 × 10⁹ and a field‐effect mobility of 227 cm 2  V −1  s −1 , benefiting from the low effective mass (0.15 m 0 ) inherent to Bi 2 O 2 S. Furthermore, Bi 2 O 2 S photodetectors display remarkable optoelectronic characteristics, including a high responsivity of 11,577 A W −1 , rapid response time in the millisecond range, and a specific detectivity of 10 14 Jones. These results confirm Bi 2 O 2 S's potential as a versatile semiconductor for next‐generation electronics, offering both BEOL‐compatible low‐temperature synthesis and high‐speed, low‐power device capabilities.

Article Details

Volume / Issue Vol. 38, Issue 8
Published February 01, 2026
ISSN 0935-9648
Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (24)

H

Hyun‐Jun Chai

Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea

M

Minsoo Kang

A

Ayoung Ham

Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea

H

Han Beom Jeong

C

Cheolmin Park

Y

Yong‐Sung Kim

Korea Research Institute of Standards &amp; Science (KRISS) Daejeon 34113 Republic of Korea

E

Eunpyo Park

Center for Semiconductor Technology Korea Institute of Science and Technology (KIST) Seoul 02792 Republic of Korea

G

Gichang Noh

Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea

M

Min‐kyung Jo

Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea

W

Woonggi Hong

Department of Foundry Engineering, Dankook University 1 , 152 Jukjeon-ro, Suji-gu, Yongin-si, Gyeonggi-do 16890,

M

Mingu Kang

T

Tae Soo Kim

S

Suhyun Kim

J

Jeongwon Park

J

Jaehyun Lee

M

Min‐gyu Kim

Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea

S

Seongdae Kwon

Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea

H

Hyeonbin Park

Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea

J

Joon Young Kwak

Division of Electronic and Semiconductor Engineering Ewha Womans University Seoul 03760 Republic of Korea

S

Seungwoo Song

Operando Methodology and Measurement Team Korea Research Institute of Standards &amp; Science (KRISS) Daejeon 34113 Republic of Korea

S

Sung‐Yool Choi

School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST) Daejeon Republic of Korea

H

Hu Young Jeong

S

Seunghwan Seo

Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea

K

Kibum Kang

Graduate School of Semiconductor Technology Korea Advanced Institute of Science and Technology (KAIST) Daejeon Republic of Korea