Memristive InAs‐Based Semiconductors with Anisotropic Ion Transport

T Taeyoung Kim J Jongbum Won J Jihong Bae (Department of Materials Science and Engineering Yonsei University Seoul South Korea) G Giyeok Lee M Minwoo Lee S Sangjin Choi (Department of Materials Science and Engineering Yonsei University Seoul 120–749 South Korea) S Sungsoon Kim D Dongchul Seo (Department of Materials Science and Engineering Yonsei University Seoul 120–749 South Korea) Y Youngjun Cho (Department of Materials Science and Engineering Yonsei University Seoul 120–749 South Korea) T Taehoon Kim (Silklab, Department of Biomedical Engineering, Tufts University) B Bokyeong Kim (Department of Materials Science and Engineering Yonsei University Seoul 120–749 South Korea) H Hong Choi (Department of Materials Science and Engineering Yonsei University Seoul South Korea) B Byung‐Kyu Yu (Center for Nanomedicine Institute for Basic Science (IBS) Seoul 03722 South Korea) J Jaegyeom Kim (Icheon branch Korea Institute of Ceramic Engineering and Technology Icheon 17303 South Korea) S Soohyung Park J Jinwoo Cheon (Center for Nanomedicine, Institute for Basic Science (IBS), Seoul 03722, Republic of Korea) J Jong‐Young Kim (Icheon branch Korea Institute of Ceramic Engineering and Technology Icheon 17303 South Korea) J Juan Bisquert (Instituto de Tecnología Química (Universitat Politècnica de València-Consejo Superior de Investigaciones Científicas), Av. dels Tarongers, València 46022, Spain) A Aloysius Soon W Wooyoung Shim

Abstract

AbstractThe use of the van der Waals (vdW) gap as an ion migration path, similar to cathode materials in lithium‐ion batteries, enables improved ion migration. If these materials also possess semiconductor properties, they can simultaneously control electron or hole transport. Such materials can be used in memtransistors, which combine memory and semiconductor characteristics. However, the existing materials rely on defects such as grain boundaries as migration paths, resulting in high ion migration energy barriers and switching voltages. Herein, memtransistors are demonstrated using HxNa2‐xIn2As3, which utilizes the vdW gap for ion migration, resulting in lower ion migration energy barriers. It is confirmed that ion migration occurs more readily in the [010] direction in a low‐symmetry crystal structure owing to a lower migration energy barrier, whereas migration does not occur in the [100] direction, demonstrating directional dependence. This finding provides crucial guidelines for identifying ion migration in semiconductor materials, which can otherwise be overlooked. The use of the vdW gap as the migration path, variation in migration energy barriers with the ion movement direction, and their impact on low power consumption are critical factors that will guide the future development of memtransistor materials.

Article Details

Volume / Issue Vol. 37, Issue 20
Published May 01, 2025
ISSN 0935-9648
Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (20)

T

Taeyoung Kim

J

Jongbum Won

J

Jihong Bae

Department of Materials Science and Engineering Yonsei University Seoul South Korea

G

Giyeok Lee

M

Minwoo Lee

S

Sangjin Choi

Department of Materials Science and Engineering Yonsei University Seoul 120–749 South Korea

S

Sungsoon Kim

D

Dongchul Seo

Department of Materials Science and Engineering Yonsei University Seoul 120–749 South Korea

Y

Youngjun Cho

Department of Materials Science and Engineering Yonsei University Seoul 120–749 South Korea

T

Taehoon Kim

Silklab, Department of Biomedical Engineering, Tufts University

B

Bokyeong Kim

Department of Materials Science and Engineering Yonsei University Seoul 120–749 South Korea

H

Hong Choi

Department of Materials Science and Engineering Yonsei University Seoul South Korea

B

Byung‐Kyu Yu

Center for Nanomedicine Institute for Basic Science (IBS) Seoul 03722 South Korea

J

Jaegyeom Kim

Icheon branch Korea Institute of Ceramic Engineering and Technology Icheon 17303 South Korea

S

Soohyung Park

J

Jinwoo Cheon

Center for Nanomedicine, Institute for Basic Science (IBS), Seoul 03722, Republic of Korea

J

Jong‐Young Kim

Icheon branch Korea Institute of Ceramic Engineering and Technology Icheon 17303 South Korea

J

Juan Bisquert

Instituto de Tecnología Química (Universitat Politècnica de València-Consejo Superior de Investigaciones Científicas), Av. dels Tarongers, València 46022, Spain

A

Aloysius Soon

W

Wooyoung Shim