Memory-induced slow relaxation in the generalized Langevin equation

M Makoto Shimizu T Tomoshige Miyaguchi (Department of Systems Engineering, Wakayama University 2 , 930 Sakaedani, Wakayama 640-8510,) E Eiji Yamamoto (Department of System Design Engineering, Keio University 3 , Yokohama, Kanagawa 223-8522,) T Takuma Akimoto (Department of Physics and Astronomy, Tokyo University of Science 1 , Noda, Chiba 278-8510,)

Abstract

We investigate the relaxation dynamics of the generalized Langevin equation (GLE) with an exponential memory kernel. Our analysis reveals that the relaxation time to equilibrium scales inversely with the square of the memory decay rate λ, i.e., τrelax ∝ λ−2. To understand the origin of this scaling, we analyze the escape dynamics from a potential well and find that the mean escape time follows the same λ−2 dependence. This indicates that the slow relaxation arises from memory-suppressed fluctuations that delay escape events. To explain these findings, we reformulate the GLE using an auxiliary variable, embedding the non-Markovian dynamics in a higher-dimensional Markovian system. This approach provides a clear physical picture of how memory influences noise, diffusion, and relaxation in non-Markovian systems.

Article Details

Volume / Issue Vol. 163, Issue 9
Published September 07, 2025
ISSN 0021-9606
Publisher American Institute of Physics

Journal Info

The Journal of Chemical Physics

American Institute of Physics

ISSN: 0021-9606 Physical Sciences

Authors (4)

M

Makoto Shimizu

T

Tomoshige Miyaguchi

Department of Systems Engineering, Wakayama University 2 , 930 Sakaedani, Wakayama 640-8510,

E

Eiji Yamamoto

Department of System Design Engineering, Keio University 3 , Yokohama, Kanagawa 223-8522,

T

Takuma Akimoto

Department of Physics and Astronomy, Tokyo University of Science 1 , Noda, Chiba 278-8510,