Mechanisms of sodium hydroxide (NaOH)-catalyzed sealing of SiO2/SiO2 direct bonding interfaces

P P. Noel (University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France) F F. Rieutord (SOITEC, Parc Technologique des Fontaines 2 , 38190 Bernin,) V V. Larrey (University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France) S S. Tardif (University Grenoble Alpes, CEA-IRIG 3 , 17 rue des Martyrs, 38000 Grenoble, France) C C. Morales (University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France) H H. Hijazi (University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France) V V. Thoréton (Univ. Grenoble Alpes 1 , CEA, Leti, F-38000 Grenoble,) A A.-M. Papon (University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France) Z Z. Saghi (University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France) D D. Landru (SOITEC, Parc Technologique des Fontaines 2 , 38190 Bernin,) F F. Fournel (4 Univ. Grenoble Alpes, CEA LETI, 17 rue des Martyrs, Grenoble cedex 9 F-38054, France)

Abstract

The introduction of NaOH catalysts at an SiO2/SiO2 hydrophilic bonding interface is investigated. Combining bonding energy measurements, interface hard x-ray reflectometry, transmission electron microscopy, and time of flight secondary ion mass spectroscopy, the change of interface morphology, and composition as a function of surface preparation is evidenced. The hydroxide catalyzed interface shows the formation of interface nanoclusters, associated with the low temperature interface sealing. A reference interface (bonded without a catalyst) is sharper. These contrasting behaviors highlight the issue of water management at the interface and the balance between interface sealing and water out-diffusion. The additional impact of oxide thickness in interfacial water management is further investigated. Finally, the catalytic interface sealing is compared with other surface preparations that achieve high bonding energies at low temperatures.

Article Details

Volume / Issue Vol. 138, Issue 5
Published August 07, 2025
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (11)

P

P. Noel

University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France

F

F. Rieutord

SOITEC, Parc Technologique des Fontaines 2 , 38190 Bernin,

V

V. Larrey

University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France

S

S. Tardif

University Grenoble Alpes, CEA-IRIG 3 , 17 rue des Martyrs, 38000 Grenoble, France

C

C. Morales

University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France

H

H. Hijazi

University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France

V

V. Thoréton

Univ. Grenoble Alpes 1 , CEA, Leti, F-38000 Grenoble,

A

A.-M. Papon

University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France

Z

Z. Saghi

University Grenoble Alpes, CEA-LETI 1 , 17 rue des Martyrs, 38000 Grenoble, France

D

D. Landru

SOITEC, Parc Technologique des Fontaines 2 , 38190 Bernin,

F

F. Fournel

4 Univ. Grenoble Alpes, CEA LETI, 17 rue des Martyrs, Grenoble cedex 9 F-38054, France