Mechanically flexible mid-wave infrared imagers using black phosphorus ink films

T Theodorus Jonathan Wijaya N Naoki Higashitarumizu (Electrical Engineering and Computer Sciences, University of California) S Shifan Wang S Shogo Tajima H Hyong Min Kim S Shu Wang D Dehui Zhang J James Bullock T Tomoyuki Yokota T Takao Someya (Thin-Film Device Laboratory, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan) A Ali Javey (Electrical Engineering and Computer Sciences, University of California)

Abstract

Abstract The mid-wave infrared (MWIR) spectral range (λ = 3–8 μm) enables important sensing and imaging applications, including non-invasive bioimaging, night vision, and autonomous navigation. Commercial MWIR photodetectors are limited to rigid imagers based on heteroepitaxial materials. There is an emerging need for mechanically flexible MWIR imagers to broaden their functionality and practicality. Recently, photodetectors using van der Waals (vdW) black phosphorus (BP) flakes have demonstrated highly sensitive room-temperature photodetection. Additionally, vdW materials are solution-processable, facilitating scalable processing and flexible device fabrication. In this work, we present flexible MWIR imagers consisting of photodiodes fabricated on thin plastic substrates using BP ink films. We demonstrate mechanically robust responsivity up to 2.5-mm bending radii and after 5000 bending cycles. Leveraging this flexibility, we achieve full-azimuthal imaging, detecting directional light sources with precision. These results establish a scalable approach for large-area, conformable MWIR imaging and pave the way for integration with flexible electronics.

Article Details

Volume / Issue Vol. 16, Issue 1
Published July 01, 2025
ISSN 2041-1723
Publisher Nature Portfolio

Journal Info

Nature Communications

Nature Portfolio

ISSN: 2041-1723 Open Access Life Sciences

Authors (11)

T

Theodorus Jonathan Wijaya

N

Naoki Higashitarumizu

Electrical Engineering and Computer Sciences, University of California

S

Shifan Wang

S

Shogo Tajima

H

Hyong Min Kim

S

Shu Wang

D

Dehui Zhang

J

James Bullock

T

Tomoyuki Yokota

T

Takao Someya

Thin-Film Device Laboratory, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan

A

Ali Javey

Electrical Engineering and Computer Sciences, University of California