Low through-plane thermal conductivity in amorphous HfO2/SiO2 nanolaminates

F Felix Mende (Fraunhofer Institute for Photonic Microsystems IPMS (Center Nanoelectronic Technologies, CNT) 1 , 01109 Dresden,) O Oliver Ostien (Fraunhofer Institute for Photonic Microsystems IPMS (Center Nanoelectronic Technologies, CNT) 1 , 01109 Dresden,) F Fred Schöne (Fraunhofer Institute for Photonic Microsystems IPMS (Center Nanoelectronic Technologies, CNT) 1 , 01109 Dresden,) R Roman Potjan (Fraunhofer Institute for Photonic Microsystems (IPMS), Center Nanoelectronic Technologies (CNT) 2 , 01109 Dresden,) I Isabelle V. Sprave (JARA-FIT Institute for Quantum Information, Forschungszentrum Jülich GmbH and RWTH Aachen University 3 , 52074 Aachen,) D Denny Dütz (JARA-FIT Institute for Quantum Information, Forschungszentrum Jülich GmbH and RWTH Aachen University 3 , 52074 Aachen,) J Jan Frede (Institute of Applied Physics, TU Dresden 2 , Nöthnitzer Strasse 61, 01187 Dresden,) T Tommy Meier (Institute of Applied Physics, TU Dresden 2 , Nöthnitzer Strasse 61, 01187 Dresden,) H Hans Kleemann M Marcus Wislicenus (Fraunhofer Institute for Photonic Microsystems (IPMS), Center Nanoelectronic Technologies (CNT) 2 , 01109 Dresden,) B Benjamin Lilienthal-Uhlig (Fraunhofer Institute for Photonic Microsystems IPMS (Center Nanoelectronic Technologies, CNT) 1 , 01109 Dresden,) L Lukas M. Eng

Abstract

Accurate knowledge of thermal transport in amorphous oxides is essential for effective thermal management in advanced semiconductor and cryogenic electronic devices. In this work, we investigate the through-plane thermal conductivity (κz) of amorphous HfO2/SiO2 nanolaminates fabricated by atomic layer deposition across the temperature range from 30 to 315 K. These multilayers serve as a model system for studying heat transport in amorphous thin films, where interfacial effects may significantly influence thermal conduction. Thermal conductivities were determined using the differential 3ω method and analyzed within the framework of the heat equation. A composite model combining the minimum thermal conductivity approach for the individual amorphous layers with the diffuse mismatch model for interfacial effects quantitatively reproduces the experimental data. The multilayers exhibit low thermal conductivities of 0.77±0.08 and 0.050±0.0015Wm−1K−1 at 300 and 30 K, respectively.

Article Details

Volume / Issue Vol. 139, Issue 9
Published March 07, 2026
ISSN 0021-8979
Publisher American Institute of Physics

Journal Info

Journal of Applied Physics

American Institute of Physics

ISSN: 0021-8979 Physical Sciences

Authors (12)

F

Felix Mende

Fraunhofer Institute for Photonic Microsystems IPMS (Center Nanoelectronic Technologies, CNT) 1 , 01109 Dresden,

O

Oliver Ostien

Fraunhofer Institute for Photonic Microsystems IPMS (Center Nanoelectronic Technologies, CNT) 1 , 01109 Dresden,

F

Fred Schöne

Fraunhofer Institute for Photonic Microsystems IPMS (Center Nanoelectronic Technologies, CNT) 1 , 01109 Dresden,

R

Roman Potjan

Fraunhofer Institute for Photonic Microsystems (IPMS), Center Nanoelectronic Technologies (CNT) 2 , 01109 Dresden,

I

Isabelle V. Sprave

JARA-FIT Institute for Quantum Information, Forschungszentrum Jülich GmbH and RWTH Aachen University 3 , 52074 Aachen,

D

Denny Dütz

JARA-FIT Institute for Quantum Information, Forschungszentrum Jülich GmbH and RWTH Aachen University 3 , 52074 Aachen,

J

Jan Frede

Institute of Applied Physics, TU Dresden 2 , Nöthnitzer Strasse 61, 01187 Dresden,

T

Tommy Meier

Institute of Applied Physics, TU Dresden 2 , Nöthnitzer Strasse 61, 01187 Dresden,

H

Hans Kleemann

M

Marcus Wislicenus

Fraunhofer Institute for Photonic Microsystems (IPMS), Center Nanoelectronic Technologies (CNT) 2 , 01109 Dresden,

B

Benjamin Lilienthal-Uhlig

Fraunhofer Institute for Photonic Microsystems IPMS (Center Nanoelectronic Technologies, CNT) 1 , 01109 Dresden,

L

Lukas M. Eng