Light‐Induced Entropy for Secure Vision (Adv. Mater. 33/2026)

Juhyung Seo; Seungme Kang; Chaehyun Kim; Taehyun Park; Youngwoo Yoo; Yeong Kwon Kim; Wonjun Shin; Byung Chul Jang; Young‐Joon Kim; Hocheon Yoo

doi:10.1002/adma.73509

Light‐Induced Entropy for Secure Vision (Adv. Mater. 33/2026)

J Juhyung Seo (Department of Electronic Engineering Hanyang University Seoul Republic of Korea) S Seungme Kang (Department of Electronic Engineering Hanyang University Seoul Republic of Korea) C Chaehyun Kim (Department of Semiconductor Engineering Gachon University Seongnam Gyeonggi‐do Republic of Korea) T Taehyun Park Y Youngwoo Yoo Y Yeong Kwon Kim (School of Electronic and Electrical Engineering Kyungpook National University Daegu Republic of Korea) W Wonjun Shin (Department of Semiconductor Convergence Engineering Sungkyunkwan University 2 , Suwon,) B Byung Chul Jang (School of Electronic and Electrical Engineering Kyungpook National University Daegu Republic of Korea) Y Young‐Joon Kim (Department of Semiconductor Engineering Gachon University Seongnam Republic of Korea) H Hocheon Yoo

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Article Details

Journal Advanced Materials

Volume / Issue Vol. 38, Issue 33

Published June 01, 2026

DOI 10.1002/adma.73509

ISSN 0935-9648

Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (10)

J

Juhyung Seo

Department of Electronic Engineering Hanyang University Seoul Republic of Korea

S

Seungme Kang

Department of Electronic Engineering Hanyang University Seoul Republic of Korea

C

Chaehyun Kim

Department of Semiconductor Engineering Gachon University Seongnam Gyeonggi‐do Republic of Korea

T

Taehyun Park

Y

Youngwoo Yoo

Y

Yeong Kwon Kim

School of Electronic and Electrical Engineering Kyungpook National University Daegu Republic of Korea

W

Wonjun Shin

Department of Semiconductor Convergence Engineering Sungkyunkwan University 2 , Suwon,

B

Byung Chul Jang

School of Electronic and Electrical Engineering Kyungpook National University Daegu Republic of Korea

Y

Young‐Joon Kim

Department of Semiconductor Engineering Gachon University Seongnam Republic of Korea

H

Hocheon Yoo

Light‐Induced Entropy for Secure Vision (Adv. Mater. 33/2026)

Article Details

Journal Info

Authors (10)

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