Interfacial Hopping Integral as a Predictive Descriptor for Electron Transport: Saturated Alkane Junctions
Article Details
Journal Info
Journal of the American Chemical Society
American Chemical Society
Authors (10)
Hao Howard Peng
Department of Chemistry and Center for Emerging Materials and Advanced Devices
Chih-Hsun Lin
Department of Chemistry and Center for Emerging Materials and Advanced Devices
Po-Wei Tung
Department of Chemistry and Center for Emerging Materials and Advanced Devices
Chun-Wei Lin
Department of Chemistry and Center for Emerging Materials and Advanced Devices
Yen-Chang Chiang
Department of Chemistry and Center for Emerging Materials and Advanced Devices
Bon-Shen Wang
Department of Chemistry and Center for Emerging Materials and Advanced Devices
Ting-Hsuan Ning
Department of Chemistry and Center for Emerging Materials and Advanced Devices
I-Chih Ni
Graduate Institute of Photonics and Optoelectronics
Chih-I Wu
Graduate Institute of Photonics and Optoelectronics
Chun-hsien Chen
Department of Chemistry and Center for Emerging Materials and Advanced Devices