Intelligent self-correcting growth of uniform Bernal-stacked bi-/trilayer graphene

W Wei Ma L Lai-Peng Ma (Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences) X Xiao Kong (National Key Laboratory of Materials for Integrated Circuits, 2020-Xlab, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences) H Han Yan Z Zhibo Liu T Tiannan Han (Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences) C Chao Zhu (School of Materials Science and Engineering) H Hui-Ming Cheng (Institute of Technology for Carbon Neutrality, Shenzhen Key Laboratory of Energy Materials for Carbon Neutrality, Shenzhen Institutes of Advanced Technology) Z Zheng Liu F Feng Ding W Wencai Ren (Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences)

Abstract

State-of-the-art synthesis strategies of two-dimensional (2D) materials have been designed following the nucleation-dominant pattern for structure control. However, this classical methodology fails to achieve the precise layer- and stacking-resolved growth of wafer-scale few-layer 2D materials due to its intrinsically low energy resolution. Here, we present an intelligent self-correcting method for the high-resolution growth of uniform few-layer graphene. We demonstrate the layer-resolved growth of wafer-scale bilayer and trilayer graphene (BLG and TLG) with selective Bernal stacking through spontaneous correction of the single-layer graphene film with disordered multilayer graphene islands. Theoretical calculations reveal that the self-correcting growth is driven by the stepwise energy minimization of the closed system and kinetically activated by forming a low-barrier pathway for the carbon detachment-diffusion-attachment. Such uniform Bernal-stacked BLG and TLG films show high quality with distinct quantum Hall effect being observed. Our work opens an avenue for developing an intelligent methodology to realize the precise synthesis of diverse 2D materials.

Article Details

Volume / Issue Vol. 122, Issue 18
Published May 06, 2025
ISSN 0027-8424
Publisher National Academy of Sciences

Authors (11)

W

Wei Ma

L

Lai-Peng Ma

Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences

X

Xiao Kong

National Key Laboratory of Materials for Integrated Circuits, 2020-Xlab, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences

H

Han Yan

Z

Zhibo Liu

T

Tiannan Han

Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences

C

Chao Zhu

School of Materials Science and Engineering

H

Hui-Ming Cheng

Institute of Technology for Carbon Neutrality, Shenzhen Key Laboratory of Energy Materials for Carbon Neutrality, Shenzhen Institutes of Advanced Technology

Z

Zheng Liu

F

Feng Ding

W

Wencai Ren

Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences