Intelligent self-correcting growth of uniform Bernal-stacked bi-/trilayer graphene
Abstract
State-of-the-art synthesis strategies of two-dimensional (2D) materials have been designed following the nucleation-dominant pattern for structure control. However, this classical methodology fails to achieve the precise layer- and stacking-resolved growth of wafer-scale few-layer 2D materials due to its intrinsically low energy resolution. Here, we present an intelligent self-correcting method for the high-resolution growth of uniform few-layer graphene. We demonstrate the layer-resolved growth of wafer-scale bilayer and trilayer graphene (BLG and TLG) with selective Bernal stacking through spontaneous correction of the single-layer graphene film with disordered multilayer graphene islands. Theoretical calculations reveal that the self-correcting growth is driven by the stepwise energy minimization of the closed system and kinetically activated by forming a low-barrier pathway for the carbon detachment-diffusion-attachment. Such uniform Bernal-stacked BLG and TLG films show high quality with distinct quantum Hall effect being observed. Our work opens an avenue for developing an intelligent methodology to realize the precise synthesis of diverse 2D materials.
Article Details
Journal Info
Proceedings of the National Academy of Sciences
National Academy of Sciences
Authors (11)
Wei Ma
Lai-Peng Ma
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences
Xiao Kong
National Key Laboratory of Materials for Integrated Circuits, 2020-Xlab, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences
Han Yan
Zhibo Liu
Tiannan Han
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences
Chao Zhu
School of Materials Science and Engineering
Hui-Ming Cheng
Institute of Technology for Carbon Neutrality, Shenzhen Key Laboratory of Energy Materials for Carbon Neutrality, Shenzhen Institutes of Advanced Technology
Zheng Liu
Feng Ding
Wencai Ren
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences