Influence of metal–semiconductor interface treatments and absorber structure on the performance and reliability of uni-traveling-carrier photodiodes (UTC-PDs)
S
Soo Cheol Kang
J
Jin Chul Cho
E
Eui Su Lee
D
Dong Woo Park
Article Details
Journal
Scientific Reports
Volume / Issue
Vol. 16, Issue 1
Published
January 05, 2026
ISSN
2045-2322
Publisher
Nature Portfolio
Authors (4)
S
Soo Cheol Kang
J
Jin Chul Cho
E
Eui Su Lee
D
Dong Woo Park
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